Preparation and Crystal Structures of Bi-Based Layered Oxides Including Fe
スポンサーリンク
概要
- 論文の詳細を見る
Three phases of bismuth iron oxides with layered structures were prepared in Bi-Sr-Ca-Fe-O, Bi-Sr-Fe-O and Bi-Ca-Fe-O systems. Phase A (c≒32 Å) is formed in the first system. High-resolution transmission electron microscopy is used to examine the structural modulation. The structure of the subcell is similar to that of Bi_2Sr_2CaCu_2O_x but the modulation periodicity is different, i.e. 4.5 times that of the subcell in the b direction (commensurate-type). For the second system, phase A as well as B (c≒40 Å) arises. The latter is with the isostructure of Bi_2Sr_2Ca_2Cu_3O_x. The modulation periodicity is about 4.5. Phase C (c≒22 Å) appears in the third system and the subcell structure is similar to that of Bi_2Sr_2CuO_x. The modulation periodicity is 3.5. All of these phases are electrically nonconductive.
- 社団法人応用物理学会の論文
- 1990-02-20
著者
-
MATSUI Yoshio
National Institute for Research in Inorganic Materials
-
HORIUCHI Shigeo
National Institute for Research in Inorganic Materials
-
Horiuchi S
National Inst. Res. In Inorganic Materials Tsukuba Jpn
-
Horiuchi S
National Inst. Res. In Inorganic Materials Ibaraki Jpn
-
Horiuchi Shigeo
National Institute For Research In Inorganic Materials (nirim)
-
Matsui Yasushi
Electronics Research Laboratory Corporate Research & Development Matsushita Electronics Corporat
-
Matsui Yoshio
National Institute For Materials Science
-
Muto Y
The Institute For Materials Research Tohoku University
-
Horiuchi S
National Institute For Research In Inorganic Materials
-
SHODA Kaoru
National Institute for Research in Inorganic Materials
-
TSUTSUMI Masayuki
National Institute for Research in Inorganic Materials
-
Shoda K
National Institute For Research In Inorganic Materials:ube Industries Ltd.
関連論文
- Planar Defects in the New Superconducting Oxide (Eu_Ce_x)_2(Ba_Eu_y)_2Cu_3O z_Observed by High-Resolution Transmission Electron Microscopy
- A New Family of Superconducting Copper Oxides : (Ln_Ce_x) 2(Ba_Ln_y)_2Cu_3O_ (Ln : Nd, Sm, Eu)
- TEM study of the influence of antisite defects on magnetic domain structures in double perovskite Ba_2FeMoO_6
- Low-Temperature Growth of SiO_2 Thin Film by Photo-Induced Chemical Vapor Deposition Using Synchrotron Radiation
- Critical-Dimension Controllability of Chemically Amplified Resists for X-Ray Membrane Mask Fabrication
- Crystal Structure of the Metastable State of Ferroelectric Lead Germanate
- Planar Defects in the New Superconducting Oxide (Eu_Ce_x)_2(Ba_Eu_y)_2Cu_3O_z Observed by High-Resolution Transmission Electron Microscopy
- A New Family Superconducting Copper Oxides : (Ln_Ce_x)_2(Ba_Ln_y)_2Cu_3O_(Ln:Nd,Sm,EU)
- New Approximant of Twelvefold Quasicrystal in Ta-Te : Electron Diffraction Study
- A 400 kV High Resolution-Analytical Electron Microscope Newly Constructed
- High-Resolution Electron Microscope Study of Silicon on Insulator Structure Grown by Lateral Solid Phase Epitaxy
- Structural Study of PtSi/(111)Si Interface with High-Resolution Electron Microscopy
- A New Metallic Langmuir-Blodgett Film Formed with BO_2-(MeO)_2TCNQ, where BO is Bisethylenedioxytetrathiafulvalene and (MeO)_2TCNQ is Dimethoxytetracyanoquinodimethane
- Cross-sectional HRTEM study of (Nd, Ce)_2CuO_4 superconducting films, prepared by post-oxidation of Cu/Nd(Ce) metal layers on SrTio_3
- Observation of the interaction of vortices with dislocations in a Nb superconductor by a cryo-Lorentz EM
- High-Resolution Transmission Electron Microscopy of Long-Period Structures of Various Phases in a Bi-Sr-Cu-O System
- Identification of the Superconducting Phase in the Nd-Ce-Sr-Cu-O System : Electrical Properties of Condensed Matter
- High-Resolution Electron Microscopy of Modulated Structure in 20 K Superconducting Oxide Bi_2Sr_2CuO_y : Electrical Properties of Condensed Matter
- High Resolution Electron Microscopy of Intergrowth and Modulated Structure in 100 K High-T_c Superconductor Bi_2 (Sr,Ca) _4Cu_3O_y : Electrical Properties of Condensed Matter
- Structure Analysis of the Bi_2(Sr,Ca)_3Cu_2O_ Superconducting Crystal Based on the Computer Simulation of HRTEM Images : Condensed Matter
- Twins and Intergrowth Defects in High-T_c Bi-Sr-Ca-Cu-O Superconductor Examined by High-Resolution Electron Microscopy : Electrical Properties of Condensed Matter
- On the 110 K Superconductor in the Bi-Ca-Sr-Cu-O System : Electrical Properties of Condensed Matter
- Possible Model of the Modulated Structure in High-T_c Superconductor in a Bi-Sr-Ca-Cu-O System Revealed by High-Resolution Electron Microscopy : Electrical Properties of Condensed Matter
- Identification of the Superconducting Phase in the Bi-Ca-Sr-Cu-O System : Electrical Properties of Condensed Matter
- High-Resolution Electron Microscopy of Modulated Structure in the New High-T_c superconductors of the Bi-Sr-Ca-Cu-O System : Electrical Properties of Condensed Matter
- High-Resolution Electron Microscopy of Planer Defects and Dislocation in Ba_2YCu_3O_y
- Electron Diffraction and Microscope Study of Ba-Nd-Cu-O Superconducting Oxides and Related Compounds
- Crystal Structure of the Superconductor Ba_Nd_Cu_3O_
- Electron Diffraction and Microscope Study of Radiation Damage in Ba_2YCu_3O_y
- Crystal Structure of Ba_La_Cu_3O_
- Preparation of (Ba, Sr)TiO_3 Thin Films by Chemical Vapor Deposition Using Liquid Sources
- Sub-100-nm Device Fabrication using Proximity X-Ray Lithography at Five Levels
- Diffuse Phase Transition and Anisotropic Evolution of Nanodomains in Nd_Sr_MnO_3(Condensed matter : electronic structure and electrical, magnetic, and optical properties)
- TEM Observation of a Piled Structure of Si/Ga/Si with Ga Monolayer
- Mask Error Factor in Proximity X-Ray Lithography
- Optimum Phase Condition for Low-Contrast X-Ray Masks
- Measurement and Calculation of SiH_2 Radical Density in SiH_4 and Si_2H_6 Plasma for the Deposition of Hydrogenated Amorphous Silicon Thin Films
- Measurement of SiH_2 Densities in an RF-Discharge Silane Plasma Used in the Chemical Vapor Deporsition of Hydrogenated Amorphous Silicon Film
- Spectroscopic Measurements of the Production and the Transport of CH Radicals in a Methane Plasma Used for the CVD of a-C:H
- On the Reaction Kinetics in a Mercury Photosensitized CVD of a-Si:H Films
- Development of methanol sensor using a shear horizontal surface acoustic wave device for a direct methanol fuel cell
- High-Quality CVD/Thermal Stacked Gate Oxide Films with Hydrogen-Free CVD SiO_2 Formed in a SiCl_4-N_2O System
- Kinetic Study of Silicon Nitride Growth from Dichlorosilane and Ammonia
- Evaluation of Acid Diffusibility in a Chemical Amplification Resist Using Acidic Water-Soluble Film
- Development of temperature-control system for liquid droplet using surface Acoustic wave devices
- Use of a low refractive index prism in surface plasmon resonance biosensing
- Dependence of SPR sensor performance on prism material and its importance in biosensor
- I-3 Deposition of thin film based on SAW streaming(Device application (English session))
- P1-27 A study on SAW streaming phenomenon based on temperature measurement and observation of streaming in liquids(Poster session 1)
- High-Performance X-Ray Mask Fabrication Using TaGeN Absorber and Dummy Pattern Method for Sub-100nm Proximity X-Ray Lithography : Instrumentation, Measurement, and Fabrication Technology
- Suppression of Pattern Edge Roughness by Low Ion Strength Developer
- Properties of Ruthenium Films Prepared by Liquid Source Metalorganic Chemical Vapor Deposition Using Ru(EtCp)_2 with Tetrahydrofuran Solvent
- Evaluation of Overlay Accuracy for 100-nm Ground Rule in Proximity X-Ray Lithography
- Conformal Platinum Electrodes Prepared by Chemical Vapor Deposition Using a Liquid MeCpPtMe_3 Precursor in an Oxidizing Atmosphere
- Development of dedicated STEM with high stability
- Thermal Stability of a RuO_2 Electrode Prepared by DC Reactive Sputtering
- Hydrogen Reduction Properties of RuO_2 Electrodes
- Performance of X-Ray Stepper for Next-Generation Lithography
- In-Situ Characterization of Si Surface Oxidation by High-Sensitivity Infrared Reflection Spectroscopic Method
- High-Sensitivity Infrared Characterization of Ultrathin SiO_2 Film by Grazing Internal Reflection Method
- A 500℃ fabrication process for MIM capacitors-based on a Ta_2O_5/Nb_2O_5 bilayer with high permittivity-for DRAM and SoC applications
- Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
- Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
- Reaction Mechanism of Chemical Vapor Deposition Using Tetraethylorthosilicate and Ozone at Atmospheric Pressure
- High Output Power Operation of a 1.3 μm Gain-Coupled Distributed Feedback Laser with Narrow Spectral Linewidth
- New Structure of 1.3 μm Strained-Layer Multi-Quantum Well Complex-Coupled Distributed Feedback Lasers
- Novel Structure of 1.3μm Strained-Layer MQW Complex-Coupled DFB Lasers
- Magnetic-Field-Induced Transition to Resistive Phase in Superconducting K-(BEDT-TTF)_2Cu[N(CN)_2]Cl
- Analysis of Decomposed Layer Appearing on the Surface of Barium Strontium Titanate
- Effects of Post-Annealing Temperatures and Ambient Atmospheres on the Electrical Properties of Ultrathin (Ba, Sr) TiO_3 Capacitors
- Irradiation Damage Caused by Ion Milling in Bismuth-Based Superconductors
- Transmission Electron Microscopy Cross-Sectional Observation on Mechanically and Chemically Lapped Si (111) Surfaces
- High Resolution Transmission Electron Microscopy of Defects in High T_c Superconductor Ba_2YCu_3O_y
- Cation-Conductive Ceramics Examined by 1 MV HRTEM
- Profile-Imaging of Wavy Cleavage Surface of Bi_2Sr_2CaCu_2O_y by High-Resolution Transmission Electron Microscopy
- Hole Confinement to CuO_2 Layers in High-T_c Cuprate Superconductors due to Crystal Potential
- Some Results Obtained by a Newly Constructed Ultra-High-Resolution 1300 kV Electron Microscope
- Preparation and Crystal Structures of Bi-Based Layered Oxides Including Fe
- T_c = 113 K Bi-Based Superconductor Prepared by Doping Fluorine
- Low-Temperature Electron Microscopy of a Bi_2(Sr, Ca)_3Cu_2O_x Superconductor
- A High Resolution Lattice Image of Nb_O_ by Means of a High Voltage Electron Microscope Newly Constructed
- A Structural Defect of Natural Magnetite Observed in an Electron Microscope Lattice Image
- Positron Annihilation in Sintered and Powdered WO_3
- Direct Observation of Oxygen Atoms in a Tetragonal YBa_2Cu_3O_ High-T_c Superconductor by Means of Ultra-High-Resolution High Voltage Electron Microscopy
- New Compound Sr_3Ca_3Cu_6O_ with Modulated Superstructure
- Semispiral Structure of Turbostratic Boron Nitride Formed under High Pressure and High Temperature
- High-Resolution Transmission Electron Microscopy of Commensurate Modulation in Bi_2Sr_2CoO_y
- X-Ray and Electron-Microscopic Studies on Single-Phase High T_c Superconductor, YBa_2Cu_3O_y
- Identification of the High T_c Superconductor in the System Y-Ba-Cu-O
- Geometrical Relations of Various Modulated Structures in Bi-Sr-Ca-Cu-O Superconductiors and Related Compounds : Electrical Properties of Condensed Matter
- Point Defects in Nb_O_ Oxidized at 200℃
- High-Pressure Synthesis of Superconducting (Cu, C)-1212 Compound (Cu, C)Ba_2(Y, Ca)Cu_2O_z
- High-Pressure Synthesis and Electron Microscopic Study of 1212 Lead Cuprates (Pb, Cu)Sr_2(Y, Ca)Cu_2O_z
- Structure of a Twin Boundary in YBa_2Cu_3O_
- Application of Imaging Plates to High-Resolution High-Voltage Electron Microscopy
- Imaging Conditions for Resolving Oxygen Atoms in ZrO_2 by an Ultra-High-Resolution High-Voltage Electron Microscope
- Preparatiorn and Structure of Al(Sr, Ca)_2HoCu_2O_7 and AlSr_2(Ho, Ca)Cu_2O_7 Cuprates
- Distribution of Oxygen Atoms in a YBa_2Cu_3O_ Superconductor Visualized by Ultra-High-Resolution Electron Microscopy
- Crystal growth of the high-TC superconductor in the Bi-Sr-Ca-Cu-O system.
- Diffuse Scattering and Crystal Structure in Hollandite-type Crystals