Raman Scattering Determination of Free Carrier Concentration and Surface Depletion Layer in (100) p-GaAs Grown by Molecular-Beam Epitaxy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1986-04-20
著者
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WAKAKI Moriaki
Department of Optical and Imaging Science and Technology, School of Engineering, Tokai University
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Ohta Koji
Nikki Inspection Services Co. Ltd.
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OKUMURA Hajime
Electrotechnical Laboratory (ETL)
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Okumura Hajime
Electrotechnical Laboratory
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Ohta K
Advanced Technology Research Laboratories Sharp Corporation
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OHTA Kimihiro
Electrotechnical Laboratory
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Ohta K
Nec Corp. Ibaraki Jpn
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Wakaki M
Tokai Univ. Kanagawa Jpn
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Wakaki Moriaki
Department O Electro-photo-optics Engineering Tokai University
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FUKASAWA Ryoichi
Department of Electro-Photo-Optics Engineering, Tokai University
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Fukasawa R
Communications Res. Lab. Ministry Of Posts And Telecommunications Kobe Jpn
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