Ohta Koji | Nikki Inspection Services Co. Ltd.
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概要
関連著者
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Ohta Koji
Nikki Inspection Services Co. Ltd.
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Ohta K
Advanced Technology Research Laboratories Sharp Corporation
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Ohta K
Nec Corp. Ibaraki Jpn
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OHTA Kimihiro
Electrotechnical Laboratory
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WAKAKI Moriaki
Department of Optical and Imaging Science and Technology, School of Engineering, Tokai University
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Wakaki M
Tokai Univ. Kanagawa Jpn
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Wakaki Moriaki
Department O Electro-photo-optics Engineering Tokai University
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Fukasawa R
Communications Res. Lab. Ministry Of Posts And Telecommunications Kobe Jpn
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山田 弘司
核融合科学研究所
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Kojima Tetsuya
Department Of Electrical Engineering School Of Engineering Nagoya Univeristy
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NAKAGAWA Tadashi
Electrotechnical Laboratory
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Nakagawa T
Riken
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Hamada Y
Nagoya Municipal Industrial Res. Inst. Nagoya Jpn
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Nakagawa Tadashi
Electroinformatics Group Nanoelectronics Research Institute National Institute Of Advanced Industria
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KOJIMA Takeshi
Electrotechnical Laboratory
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Kojima T
Department Of Electrical Engineering School Of Engineering Nagoya Univeristy
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Watanabe Takeo
Univ. Hyogo Hyogo Jpn
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FUKASAWA Ryoichi
JASCO Corporation
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Watanabe Takayuki
Department of Innovative and Engineered Materials, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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OBARA Minoru
Department of Electronics and Electrical Engineering, Faculty of Science and Technology, Keio Univer
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Obara Minoru
Department Of Electrical Engineering Faculty Of Science And Technology Keio University
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Obara Minoru
Department Of Electrical Engineering Faculty Of Engineering Keio University
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Watanabe Takeharu
JGC Corporation
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Yamada Hiroaki
Nihon University, College of Industrial Technology
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Chen Ruquan
Shantou Institure of Ultrasonic Instruments
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Cai Henghui
Shantou Institure of Ultrasonic Instruments
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Yao Jinzhong
Shantou Institure of Ultrasonic Instruments
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OHTA Koji
Safety and Inspection Center, JGC Corporation
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WATANABE Takeharu
Safety and Inspection Center, JGC Corporation
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KOJIMA Chihiro
Safety and Inspection Center, JGC Corporation
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YAMADA Hiroaki
Institute of Industrial Science, University of Tokyo
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OKUMURA Hajime
Electrotechnical Laboratory (ETL)
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Okumura Hajime
Electrotechnical Laboratory
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ohta kei
Department of Cardiology, Showa University Fujigaoka Hospital
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Watanabe T
Department Of Innovative And Engineered Materials Interdisciplinary Graduate School Of Science And E
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TAKAHASHI Naoki
Electrotechnical Laboratory
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FUJITA Takahiro
Electrotechnical Laboratory
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MATSUMOTO Yutaka
Electrotechnical Laboratory
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NAGATA Yujiro
College of Science and Engineering, Aoyama Gakuin University
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Sano H
Japan Advanced Inst. Sci. And Technol. Ishikawa Jpn
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Saito H
Nec Corp. Ibaraki Jpn
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Nagata Yujiro
College Of Science & Engineering Aoyama Gakuin University
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Kojima C
Sony Corp. Yokohama Jpn
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OHTA Keizo
College of Science and Engineering, Aoyama Gakuin University
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Ohta Keizo
College Of Science & Engineering Aoyama Gakuin University
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NISHIZAWA Seiji
JASCO Corporation
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Sano Hiroyuki
College of Science & Engineering, Aoyama Gakuin University
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SAITO Hideaki
Laser Laboratory, Second Research Center, TRDI, Japan Defense Agency
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DJEU Nicholas
Department of Physics, University of South Florida
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SHIRAWACHI Kikuo
JASCO Corporation
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FUKASAWA Ryoichi
Department of Electro-Photo-Optics Engineering, Tokai University
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Nishizawa S
Jasco Corp. Tokyo Jpn
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Djeu Nicholas
Department Of Physics University Of South Florida
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Sano Hiroyuki
College Of Science & Engineering Aoyama Gakuin University:(present Address)tdk Co. Ltd.
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Shirawachi K
Jasco Corporation
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Yamada Hiroaki
Institute Of Industrial Science University Of Tokyo
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Saito Hideaki
Laser Laboratory Second Research Center Trdi Japan Defense Agency
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Saito Hideaki
Laser Laboratory Industrial Research Institute
著作論文
- D-4 Manufacturing Technology of High Resolution Probes for NDT
- Enhancement of Ultrasonic Testing Equipment Time Based Resolution by Synthetic Waveform Generator : Ultrasonic Microscopy and Nondestructive Testing
- Miniband Base Transistor
- Sharp Resonance Characteristics in Triple-Barrier Diodes with a Thin Undoped Spacer Layer
- Hard Magnetic MnAl and MnBi Ribbons Made from Molten State by Rapid Cooling
- Characterization of a Longitudinally Pumped CW, Room-Temperature Operation of Tm^:YVO_4 Laser
- Far-Infrared Reflectance Spectra of Al_xGa_As/GaAs Superlattices for Various Al Mole Fractions
- Far-Infrared Reflectance Spectra of Heavily Doped p-GaAs for Various Hole Concentrations
- Raman Scattering Determination of Free Carrier Concentration and Surface Depletion Layer in (100) p-GaAs Grown by Molecular-Beam Epitaxy