Far-Infrared Reflectance Spectra of Al_xGa_<1-x>As/GaAs Superlattices for Various Al Mole Fractions
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概要
- 論文の詳細を見る
We report far-infrared reflectance spectra of Al_xGa_<1-x>As/GaAs superlattices with various aluminium (Al) mole fractions (0.1<x<0.7). The experimental reflectance spectra agree well with the calculated ones derived using the characteristic-matrix method within the theory of thin-film optics.
- 社団法人応用物理学会の論文
- 1992-08-15
著者
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WAKAKI Moriaki
Department of Optical and Imaging Science and Technology, School of Engineering, Tokai University
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Ohta Koji
Nikki Inspection Services Co. Ltd.
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Ohta K
Advanced Technology Research Laboratories Sharp Corporation
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OHTA Kimihiro
Electrotechnical Laboratory
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Ohta K
Nec Corp. Ibaraki Jpn
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Wakaki M
Tokai Univ. Kanagawa Jpn
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Wakaki Moriaki
Department O Electro-photo-optics Engineering Tokai University
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NISHIZAWA Seiji
JASCO Corporation
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FUKASAWA Ryoichi
JASCO Corporation
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SHIRAWACHI Kikuo
JASCO Corporation
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Nishizawa S
Jasco Corp. Tokyo Jpn
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Shirawachi K
Jasco Corporation
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Fukasawa R
Communications Res. Lab. Ministry Of Posts And Telecommunications Kobe Jpn
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