In-Situ Ellipsometric Observations of Thickness Change in the Layers of Ag/a-As_2S_3 Film System with Progression of Photodoping
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-02-15
著者
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Ogawa T
Faculty Of Engineering Takushoku University
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Ogawa Tohru
Technology Strategy Development Sony Co. Core Technology & Network Company
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WAKAKI Moriaki
Department of Optical and Imaging Science and Technology, School of Engineering, Tokai University
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Ogawa Tetsuya
Institute For Chemical Research Kyoto University
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MURAKAMI Yoshihisa
Tsukuba College of Technology
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OGAWA Tsutomu
Institute for Applied Optics
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KAWABATA Shuichi
Faculty of Engineering, Tokyo Institute of Polytechnics
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Wakaki Moriaki
Department O Electro-photo-optics Engineering Tokai University
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Kawabata Shuichi
Faculty Of Engineering Tokyo Institute Of Polytechnics
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