In-Situ Observation of Photodoping Process in a Chalcogenide Glass As_2S_3 by Ellipsometry

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Photodarkning, photobleaching, photostopping and photodoping are well-known photo-induced phenomena in chalcogenide glasses. In this study, the process of photodoping of Ag into amorphous chalcogenide materials As_2S_3 was examined by the in-situ ellipsometry. A Ag/As_2S_3 double layer on a glass substrate was prepared by a vacuum evaporation method. The experimental values of ellipsometric parameters ψ and ⊿ were fitted with two different models. One is Three Layer Model (TLM) consisting of Ag/Ag : As_2S_3/As_2S_3 layers and another is Four Layer Model (FLM) introduced Ag cluster layer into the interface of Ag : As_2S_3 and As_2S_3 in TLM. Both simulations using TLM and FLM reproduced the experimental ⊿-ψ curve well. Especially, it was found that FLM including Ag cluster layer explained photodoping process well, and the maximum thickness of the cluster layer was about 1nm through the process. New doping mechanism was discussed based on these simulation results.
東海大学の論文