Ellipsometric Study of Silicate Treatment of Aluminum Offset Printing Plates

概要

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The silicate treatment of aluminum offset printing plates has been studied by ellipsometry. Aluminum is very reactive with oxygen and the aluminum surface is easily oxidized in the atmosphere. The presence of the oxide layer on the aluminum surface brings about some ambiguities in the analysis of the ellipsometric data of the overlaid film. Few researchers have estimated the thickness of a siliceous film on aluminum plates as far as we know. However their estimations are very vague, ranging from. one monolayer (〜0.3nm) to 1μm.^<1, 2)> We carried out a series of experiments to determine the thickness of a siliceous film on an aluminum surface by means of ellipsometry. The thicknesses of the siliceous films on the aluminum film surface were successfully estimated by applying Bruggeman's effective medium approximation to composite layer of the aluminum and the aluminum oxide. In our experiments, the thicknesses of the composite layer and the siliceous film were estimated to be in the range from 1.3nm to 1.6nm and about 0.7nm, respectively.
社団法人応用物理学会の論文
2000-09-15