Analysis of the Influence of Carrier Scattering in the Channel of a Metal/Insulator Tunneling Field Effect Transistor

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1998-11-15

著者

• Asada Masahiro

  Department of Neurosurgery, Chibune Hospital

• Asada Masahiro

  Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology

• Yamazaki K

  Ntt Corp. Kanagawa Jpn

• Saito W

  Tokyo Inst. Technol. Tokyo Jpn

• Saito Wataru

  Institute Of Agriculture And Forestry University Of Tsukuba

• SAITOH Wataru

  Department of Electrical and Electronic Engineering, Tokyo Institute of Technology

• Yamazaki K

  Ntt Basic Research Laboratories Ntt Corporation

• Yamazaki Katsuyuki

  The Faculty Of Engineering Tokyo Institute Of Technology : (presently) Canon Inc.

• YAMAZAKI Katsuyuki

  Department of Electrical and Electronic Engineering, Tokyo Institute of Technology

• TSUTSUI Masafumi

  Department of Electrical and Electronic Engineering, Tokyo Institute of Technology

• Saitoh Wataru

  Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology

• Saito W

  Toshiba Corp. Kawasaki Jpn

• Tsutsui M

  Tokyo Inst. Technol. Tokyo Jpn

• Tsutsui Masafumi

  Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology

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