Shortening of Detection Time for Observation of Hot Electron Spatial Distribution by Scanning Hot Electron Microscopy
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概要
- 論文の詳細を見る
The scanning hot electron microscope (SHEM) is a tool to observe non-thermal- equilibrium electrons under the surface of a solid, and it enables us to study the hot electron diffraction pattern caused by a small structure in the propagation layer. To observe the hot electron spatial distribution by SHEM, the detection time must be shortened. The reduction of the noise current including vibrational noise is investigated comprehensively. By the reduction of noise, in particular, that of nonstationary noise with digital measurements, the hot electron current was detected in 30 s, 1/20 of the measurement time reported previously.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1999-04-15
著者
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Asada Masahiro
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Ikeda Yoshihiro
Department Of Cardiology Himeji Cardiovascular Center
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Furuya Kazuhito
Department Of Electrical And Electronic Engineering
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ZHANG Bingyang
Quantum Effect Electronics Research Center, Tokyo Institute of Technology
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WATANABE Masahiro
Quantum Effect Electronics Research Center, Tokyo Institute of Technology
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Kikegawa Nobutaka
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Saito Wataru
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Sakai Norio
Department Of Biopharmaceutics And Drug Rational Research Center School Of Pharmacy Tokyo University
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Zhang Bingyang
Quantum Effect Electronics Research Center, Tokyo Institute of Technology,
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Ikeda Yoshihiro
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology,
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Kikegawa Nobutaka
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology,
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Asada Masahiro
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology,
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