Effect of Residual Stress in Thin Films on the Radiation Spectrum of a Semiconductor Laser
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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Miura Hideo
Fracture And Reliability Research Institute Graduate School Of Engineering Tohoku University
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Sasaki Minoru
Department Of Acoustic Design Kyushu Institute Of Design
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Suzuki Ken
Fracture And Reliability Research Institute Graduate School Of Engineering Tohoku University
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KAWAUCHI Taira
Fracture and Reliability Research Institute, Graduate School of Engineering, Tohoku University
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Kawauchi Taira
Fracture And Reliability Research Institute Graduate School Of Engineering Tohoku University
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MIURA Hideo
Fracture and Reliability Research Institute, Graduate School of Engineering, Tohoku University
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MIURA Hideo
Fracture and Reliability Research Institute (FRRI), Graduate School of Engineering, Tohoku University
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SUZUKI Ken
Fracture and Reliability Research Institute (FRRI), Graduate School of Engineering, Tohoku University
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