New Method of Extracting Inversion Layer Thickness and Charge Profile and Its Impact on Scaled MOSFETs

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概要

• 論文の詳細を見る
• 1996-08-26

著者

• Hu Chenming

  Department Of Electrical Engineering & Computer Sciences University Of California

• Hu Chenming

  Department Of Electrical Engineering And Computer Sciences University Of California At Berkeley

• SUGII Toshihiro

  FUJITSU LABORATORIES LTD.

• TANAKA Tetsu

  Fujitsu Laboratories Ltd.

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