Dependence of Ferroelectric Properties on Thickness of BiFeO_3 Thin Films Fabricated by Chemical Solution Deposition
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-12-30
著者
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UCHIDA Hiroshi
Department of Materials and Life Sciences, Sophia University
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Funakubo H
Dep. Of Innovative And Engineered Materials Tokyo Inst. Of Technol.
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Uchida H
Department Of Chemistry Faculty Of Science And Technology Sophia University
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KODA Seiichiro
Department of Chemistry, Faculty of Science and Technology, Sophia University
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SINGH Sushil
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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UENO Risako
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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FUNAKUBO Hiroshi
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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ISHIWARA Hiroshi
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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