A Novel Process for Fabrication of Gated Silicon Field Emitter Array Taking Advantage of Ion Bombardment Retarded Etching
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概要
- 論文の詳細を見る
- 2005-07-15
著者
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Matsuya Iwao
Kagami Memorial Laboratory For Materials Science And Technology Waseda University
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TANII Takashi
School of Science and Engineering, Waseda University
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FUJITA Satoru
School of Science and Engineering, Waseda University
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NUMAO Yoshiteru
School of Science and Engineering, Waseda University
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SAKAIRI Mitsuaki
School of Science and Engineering, Waseda University
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MASAHARA Meishoku
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology
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OHDOMARI Iwao
School of Science and Engineering, Waseda University
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Tanii Takashi
School Of Science And Engineering Waseda University
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Numao Yoshiteru
School Of Science And Engineering Waseda University
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Ohdomari Iwao
Faculty Of Science And Engineering Waseda University
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