Characterization of Charged Traps near Si-SiO_2 Interface in Photo-Induced Chemical Vapor Deposited SiO_2 Film

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概要

• 論文の詳細を見る
• 1996-02-01

著者

• Yamamoto Hideaki

  Department of Regulation Biology, Faculty of Science, Saitama University

• KANASHIMA Takeshi

  Graduate School of Engineering Science, Osaka University

• Hamakawa Yoshihiro

  Faculty Of Science And Engineering Ritsumeikan University

• Hamakawa Yoshihiro

  Department Of Electrical Engineering Faculty Of Engineering Science Osaka University

• OKUYAMA Masanori

  Department of Electrical Engineering, Facully of Engineering Science, Osaka University

• KANASHIMA Takeshi

  Department of Physical Science, Graduate School of Engineering Science, Osaka University

• Okuyama Masanori

  Department Of Electrical Engineering Faculty Of Engineering Schience Osaka University

• Okuyama Masanori

  Faculty Of Engineering Science Osaka University

• IWASAKI Shinya

  Department of Applied Biochemistry, Utsunomiya University

• Yamamoto Hideaki

  Department Of Electrical Engineering Faculty Of Engineering Science Osaka University

• Kanashima Takeshi

  Graduate School Of Engineering Science Osaka University

• Kanashima Takeshi

  Department Of Electrical Engineering Faculty Of Engineering Science Osaka University

• Kanashima Takeshi

  Division Of Advanced Electronics And Optical Science Department Of System Innovation Graduate School

• Okuyama M

  Osaka Univ. Osaka Jpn

• Hamakawa Y

  Faculty Of Science And Engineering Ritsumeikan University

• Iwasaki Shinya

  Department Of Electrical Engineering Faculty Of Engineering Science Osaka University

• Hamakawa Yoshihiro

  Department Of Electrical Engineering Faculty Of Engineering Osaka University

• OKUMURA Katsuhide

  Department of Electrical Engineering, Faculty of Engineering Science, Osaka University

• Kanashima Takeshi

  Area Of Materials And Device Physics Department Of Physical Science Graduate School Of Engineering S

• Okumura Katsuhide

  Department Of Electrical Engineering Faculty Of Engineering Science Osaka University

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