Characterization of Surface Potential and Strain at Ultrathin Oxide/Silicon Interface by Photoreflectance Spectroscopy
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概要
- 論文の詳細を見る
- 1996-02-01
著者
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Hamakawa Yoshihiro
Faculty Of Science And Engineering Ritsumeikan University
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Hamakawa Yoshihiro
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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OKUYAMA Masanori
Department of Electrical Engineering, Facully of Engineering Science, Osaka University
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Fujimoto Akira
Department Of Electrical Engineering Wakayama National College Of Technology
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Fujimoto A
Wakayama National Coll. Technol. Wakayama Jpn
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Okuyama Masanori
Department Of Electrical Engineering Faculty Of Engineering Schience Osaka University
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Hamakawa Y
Faculty Of Science And Engineering Ritsumeikan University
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IMAI Takaaki
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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Imai Takaaki
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Fujimoto A
Department Of Electrical Engineering Wakayama National College Of Technology
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Hamakawa Yoshihiro
Department Of Electrical Engineering Faculty Of Engineering Osaka University
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