Matsumoto Satoru | Department of Cardiology, Toyonaka Municipal Hospital

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著作論文

Contribution of Adiponectin Gene Mutation to Coronary Artery Disease
Association of Hypo-Adiponectinemia with Coronary Artery Disease in Women
A Novel Plasma Protein Abundantly Expressed in Visceral Fat, Visfatin, Associated with Coronary Artery Disease
Evaluation of FcεRI-binding serum IgE in patients with ocular allergic diseases
Self-Diffusion in Intrinsic and Extrinsic Silicon Using Isotopically Pure ^Silicon/Natural Silicon Heterostructures
Self-Diffusion in Extrinsic Silicon Using Isotopically Enriched ^Si Layer : Semiconductors
Epitaxial Growth of Pure ^Si Layers on a Natural Si(100) Substrate Using Enriched ^SiH_4
The Distribution of the Excess Vacancies in the Bulk at the Diffusion of Phosphorus into Silicon
Phosphorus Diffusion in Silicon Free from the Surface Effect under Extrinie Conditions
The Confirmation of the Surface Effect upon Phosphorus Diffusion into Silicon
Determination of Diffusion Coefficient of Phosphorus in Silicon by Boltzmann-Matano's Method
Phosphorus Diffusion from Doped Polysilicon through Ultra-Thin SiO_2 Films into Si Substrates
Time and Temperature Dependence of Density of Oxidation-Induced Stacking Faults in Diamond-Lapped Silicon
Chemical Vapor Deposition of Cu Film on SiO_2 Using Cyclopentadienylcoppertriethylphosphine
Anitimony Diffusion into Sillicon by the Doped Oxide Method
Phosphorus Diffusion into Silicon under the Condition of Controlled Surface Concentration
Electrical Conductivity of p-Type CdCr_2Se_4 Single Crystals
Electrical Properties of Amorphous Semiconductor Ge_xS_
The Effect of Thermal Oxidation of Silicon on Boron Diffusion in Extrinsic Conditions
Concentration Dependence of the Diffusion Coefficient of Boron in Silicon
Evaluation of the Scattering Factor in Amorphous Ge_xTe_
Surface Passivation of In_Al_AS Using (NH_4)_2S_x and P_2S_5/(NH_4)_2S
EL2 Out-Diffusion in Thermally Annealed Liquid-Encapsulated Czochralski GaAs
Two-Dimensional Analysis of Thermal Oxidation of Silicon
Deep Level Induced by Thermal Oxidation in CZ n-Type Silicon : Semiconductors and Semiconductor Devices
Shallow Doping of Boron into Silicon by Excimer Laser Irradiation : Beam Induced Physics and Chemistry
Solutions of Simultaneous Equations for Oxidation Enhanced and Retarded Diffusions and Oxidation Stacking Fault in Silicon
Excimer Laser Doping of Boron into Silicon from Photodeposited Boron Films : Beam Induced Physics and Chemistry
Optical Measurement of the Melt Depth During Pulsed Laser Irradiation
Self-Diffusion in Intrinsic and Extrinsic Silicon Using Isotopically Pure 30Silicon/Natural Silicon Heterostructures
Cathodoluminescence Investigation of Relaxed Si1-xGex Layer and Composition-Graded SiGe Layer
Surface Modification of Porous Silica with the Liquid Phase Deposition Process Using Solid Materials for Fluorine Scavenger
Effect of Dopant Concentration on Oxidation-Induced Stacking Faults in Boron-Doped CZ Silicon : Semiconductors and Semiconductor Devices
Present Status of the Reconstructed Large Mass Spectroscope
Characteristics of Ohmic Contacts to n-Type Boron Phosphide
Role of Electron Traps on the Thermal Conversion and Its Suppression for Liquid-Encapsulated Czochralski GaAs Single Crystals
Precise Mass Calibration Method for Mass Spectrograph I.General Mass Center Method
Crystal Structures of Stacked Ionic Assemblies of Tetracationic and Tetraanionic Porphyrins

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