Time and Temperature Dependence of Density of Oxidation-Induced Stacking Faults in Diamond-Lapped Silicon
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1984-08-20
著者
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Matsumoto Satoru
Department of Cardiology, Toyonaka Municipal Hospital
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Kaneko Hiroyuki
Department of Genetic Resources II, National Institute of Agrobiological Resources, Tsukuba, Ibaraki
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Kaneko H
Department Of Biology Keio University
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ISHIHARA Ichiro
Department of Electrical Engineering, Keio University
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Ishihara Ichiro
Department Of Electrical Engineering Keio University
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Kaneko Hiroyuki
Department Of Animal Production Kyushu National Agricultural Experiment Station
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Kaneko Hiroyuki
Department Of Electrical Engineering Keio University
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