Growth and Characterization of Epitaxial ZnO Nanowall Networks Using Metal Organic Chemical Vapor Deposition
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概要
- 論文の詳細を見る
ZnO nanowall networks with a honeycomblike pattern on GaN/sapphire substrates were deposited by metalorganic chemical vapor deposition (MOCVD) without using any metal catalysts. The effects of growth temperature and VI/II ratio on the surface morphology and optical properties of ZnO nanowall networks were investigated by scanning electron microscopy (SEM) and photoluminescence (PL) analysis. The SEM image obtained shows a prominent nanowall-network structure when the growth temperature is higher than 550 °C. The wall width and network size of ZnO nanowall-network structures grown by MOCVD were found to change depending on DEZn flow rate. The surface morphology of ZnO structures was observed at different time intervals from 10 to 40 min to investigate the formation mechanism of ZnO nanowall networks. The room-temperature PL measurement of ZnO nanostructures grown on GaN/sapphire substrates shows high-intensity ultraviolet peaks at 385 nm without any "green peak". The PL spectrum suggests that the quantum confinement effects are caused by the nanostructure of ZnO.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2008-01-25
著者
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Horng Ray-hua
Institute Of Precision Egineering National Chung Hsing University
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Lin Po-rung
Department Of Materials Engineering National Chung Hsing University
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Yu Ting-en
Department Of Materials Engineering National Chung Hsing University
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Lai Hsin-yi
Department Of Mechanical Engineering National Cheng-kung University
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Wu Chia-cheng
Department Of Materials Engineering National Chung Hsing University
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Chen Tsai-ning
Department Of Materials Engineering National Chung Hsing University
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Wuu Dong-Sing
Department of Electrical Engineering, Da-Yeh University
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Lai Hsin-Yi
Department of Mechanical Engineering, National Cheng Kung University, Tainan, Taiwan 701, R.O.C.
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Yu Ting-En
Department of Materials Science and Engineering, National Chung Hsing University, Taichung, Taiwan 402, R.O.C.
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Chen Tsai-Ning
Department of Materials Science and Engineering, National Chung Hsing University, Taichung, Taiwan 402, R.O.C.
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Lin Po-Rung
Department of Materials Science and Engineering, National Chung Hsing University, Taichung, Taiwan 402, R.O.C.
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Wu Chia-Cheng
Department of Materials Science and Engineering, National Chung Hsing University, Taichung, Taiwan 402, R.O.C.
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Horng Ray-Hua
Institute of Electrical Engineering, Da-Yeh University, Chang-Hwa 515, Taiwan, ROC
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