A New Type VUV Detector with Plane Electrodes Deposited on a Crystalline Quartz
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概要
- 論文の詳細を見る
A new type VUV detector with plane electrodes deposited on a crystalline quartz has been fabricated and evaluated. The external quantum efficiency of the detector was measured for radiation between 45 nm and 140 nm, and has a maximum value of about four percent at 70 nm. The fundamental absorption edge of the crystalline quartz is found to be at 150 nm. The noise equivalent power for this detector is about 1.25×10<SUP>-11</SUP> W. The detector was employed on trial to measure the helium discharge spectrum, and has given satisfactory results.
- 社団法人 プラズマ・核融合学会の論文
著者
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Umeno Masayoshi
Department Of Electric And Computer Engineering Nagoya Institute Of Technology
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Jimbo Takashi
Department Of Electrical And Computer Engineering Nagoya Institute Of Technology
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HATTORI Shuzo
Department of Electrical and Computer Engineering, Nagoya Institute of Technology
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SHAO Chun-Lin
Department of Electronics
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Ishii Kazushige
Institute Of Plasma Physics Nagoya University
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Tomita Kazuhiro
Department Of Engineering Science Nagoya Institute Of Technology
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Tomita Kazuhiro
Department of Electronics and Computer Engineering, Nagoya Institute of Technology
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Tomita Kazuhiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Shao Chun-Lin
Department of Electronics, Nagoya University
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邵 春林
Department of Electronics, Nagoya University
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Umeno Masayoshi
Department of Electronics and Computer Engineering, Nagoya Institute of Technology
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