Time-of-flight法を用いたルブレン有機単結晶のキャリア輸送特性評価(薄膜(Si,化合物,有機,フレキシブル)機能デバイス・材料・評価技術)

概要

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We have developed a time-of-flight (TOP) measurement system to evaluate lateral charge carrier transport in organic semiconductor films. In our system we used a rod or rectangular film as the sample with a length of l-2mm with both the ends contacted to electrodes to apply a DC electric field in the sample where the side surface of the sample is fixed to a thin glass plate with a slit. The slit is used to define the UV irradiated area in the sample. We have found that it is possible to obtain lateral TOFs of electron and hole simultaneously by adjusting the UV irradiated area at a certain distance to the end of the electrode. In the present paper, we describe the details of the system and a TOP measurement with a rubrene single crystal as an example, which attracts much attention due to its high hole mobility in excess of 10cm^2/Vs.
社団法人電子情報通信学会の論文
2007-04-13