Effects of Etch-Induced Damage and Contamination on the Physical and Electrical Properties of Cobalt Silicides
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-10-15
著者
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PARK Jong-Wan
Department of Physics, Chungbuk National University
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KO Young-Wook
LCD Division, Hyundai Electronics Industries Co., Lid.
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YEOM Geun-Young
Department of Materials Engineering, Sungkyunkwan University
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Lee Yong-hyuk
Department Of Materials Sciences & Engineering Sungkyunkwan University
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Yeom Geun-young
Department Of Materials Engineering Sungkyunkwan University
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Kim Hyeon-soo
Department Of Materials Engineering Sungkyunkwan University
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Ko Young-wook
Lcd Division Hyundai Electronics Industries Co. Ltd
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Park Jong-wan
Department Of Metallugical Engineering Hanyang University
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Yoon Jong-Ku
Department of Inorganic Chemistry, National Institute of Technology and Quality
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Yoon Jong-ku
Department Of Inorganic Chemistry National Institute Of Technology And Quality
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Lee Yong-hyuk
Department Of Materials Engineering Sungkyunkwan University
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Lee Young-Hyuk
Department of Materials Engineering, Sungkyunkwan University
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PARK Jong-Wan
Department of Biomedical Sciences, Seoul National University, College of Medicine
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