Lee Yong-hyuk | Department Of Materials Sciences & Engineering Sungkyunkwan University
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概要
関連著者
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Lee Yong-hyuk
Department Of Materials Sciences & Engineering Sungkyunkwan University
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Yeom Geun-young
Department Of Materials Engineering Sungkyunkwan University
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Lee Yong-hyuk
Department Of Materials Engineering Sungkyunkwan University
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YEOM Geun-Young
Department of Materials Engineering, Sungkyunkwan University
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Yeom Geun-young
Department Of Materials Sciences & Engineering Sungkyunkwan University
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Kyung Se-jin
Department Of Materials Sciences & Engineering Sungkyunkwan University
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Kyung Se-Jin
Department of Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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PARK Jong-Wan
Department of Physics, Chungbuk National University
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KO Young-Wook
LCD Division, Hyundai Electronics Industries Co., Lid.
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Jeong Chang-hyun
Department Of Materials Science And Engineering Sung Kyun Kwan University
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Lim Jong-hyuk
Department Of Electrical And Computer Engineering Hanyang University
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Lim Jong-hyuk
Department Of Materials Science And Engineering Sungkyunkwan University
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Yeom Geun-young
Department Of Materials Science And Engineering Sungkyunkwan University
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Kim Hyeon-soo
Department Of Materials Engineering Sungkyunkwan University
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Ko Young-wook
Lcd Division Hyundai Electronics Industries Co. Ltd
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Park Jong-wan
Department Of Metallugical Engineering Hanyang University
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Yoon Jong-Ku
Department of Inorganic Chemistry, National Institute of Technology and Quality
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Yoon Jong-ku
Department Of Inorganic Chemistry National Institute Of Technology And Quality
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Lee Yong-hyuk
Department Of Materials Science And Engineering Sungkyunkwan University
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Jeong Chang-hyun
Department Of Materials Sciences & Engineering Sungkyunkwan University
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Lee Young-Hyuk
Department of Materials Engineering, Sungkyunkwan University
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PARK Jong-Wan
Department of Biomedical Sciences, Seoul National University, College of Medicine
著作論文
- A Study of Electrical Damage to a-Si:H Thin Film Transistor during Plasma Ashing by a Pin-to-Plate Type Atmospheric Pressure Plasma
- The Effect of N_2 Flow Rate in He/O_2/N_2 on the Characteristics of Large Area Pin-to-Plate Dielectric Barrier Discharge
- Effects of Etch-Induced Damage and Contamination on the Physical and Electrical Properties of Cobalt Silicides
- Properties and Applications of a Modified Dielectric Barrier Discharge Generated at Atmospheric Pressure