Direct Evidence for the Negative-U Property of the DX Center as Studied by Hydrostatic Pressure Experiments on GaAs Simultaneously Doped with Ge and Si
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1990-03-20
著者
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Fujisawa Toshio
Faculty Of Engineering Tokyo Institute Of Technology
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Yoshino Junji
Imaging Science And Engineering Laboratory Tokyo Institute Of Technology
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Kukimoto H
National Space Dev. Agency Of Japan Ibaraki Jpn
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Yoshino J
Department Of Physics Tokyo Institute Of Technology
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KUKIMOTO Hiroshi
Imaging Science and Engineering Laboratory,Tokyo Institute of Technology
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Fujisawa Takeshi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Kukimoto H
Imaging Science And Engineering Laboratory Tokyo Institute Of Technology:(present Address)toppan Pri
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Fujisawa Toshimasa
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology
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Fujisawa Toshimasa
Imaging Science And Engineering Laboratory Tokyo Institute Of Technology
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Kukimoto Hiroshi
Imaging Science And Engineering Lab. Tokyo Institute Of Technology
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