A Localized Defect in InP with Strong Temperature Dependence of Capture Cross-Section
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1984-01-20
著者
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Mizuta Masashi
Imaging Science And Engineering Laboratory Tokyo Institute Of Technology
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KUKIMOTO Hiroshi
Imaging Science and Engineering Laboratory,Tokyo Institute of Technology
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Ogura Mototusgu
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology
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Kukimoto Hiroshi
Imaging Science And Engineering Lab. Tokyo Institute Of Technology
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Ogura Mototsugu
Imaging Science And Engineering Laboratory Tokyo Institute Of Technology
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Ogura Mototusgu
Imaging Science And Engineering Laboratory Tokyo Institute Of Technology
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Mizuta Masashi
Imaging Science And Engineering Lab. Tokyo Institute Of Technology
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