Atom Intensity Variation in the Scanning Tunneling Microscope Image of Mixed Crystals of Transition Metal Dichalcogenides
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概要
- 論文の詳細を見る
Two kinds of mixed crystals of transition metal dichalcogenides (TX_2), Mo_<1-X>W_XSe_2 and MoSe_<2-Y>S_Y, have been studied using the scanning tunneling microscope (STM). Both mixed crystals have shown atom intensity variation in STM images, whereas very uniform atom images have been observed for pure MoSe_2. This indicates that both surface and subsurface atom substitutions induce atom intensity variations. The observed features can be explained qualitatively in terms of their band structures.
- 社団法人応用物理学会の論文
- 1992-09-15
著者
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Mori Tomohiko
Department Of Chemistry University Of Tokyo
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Saiki Koichiro
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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Saiki Koichiro
Department Of Chemistry University Of Tokyo
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Koma Atsushi
Department Of Applied Physics University Of Tokyo
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