High-Resolution Electron Energy Loss Spectroscopy on C_<60> and C_<70> Epitaxial Films

概要

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Vibrational spectra of C_<60> and C_<70> epitaxial films grown on cleaved surfaces of MoS_2 have been measured by high-resolution electron energy loss spectroscopy. In the case of C_<60>, three intense dipole-active peaks were observed, which correspond to IR-active modes of C_<60> under the specular reflection condition. In the case of C_<70>, on the other hand, seven dipole-active peaks were found under the specular reflection condition only after annealing, which indicates that the flatness of the surface of the C_<70> film was improved by annealing. The spectra of C_<60> and C_<70> under the off-specular reflection condition, which correspond to the vibrational densities of states of C_<60> and C_<70> molecules, resemble each other, indicating that the observed vibrational densities of states are characteristic of fullerenes.
社団法人応用物理学会の論文
1995-02-01