Characterization of Epitaxial Films of Layered Materials Using Moire Images of Scanning Tunneling Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-06-30
著者
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KOMA Atsushi
Department of Chemistry, The University of Tokyo
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ABE Hideki
Department of Ophthalmology, Chiba University Hospital
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Abe Hideki
Department Of Chemistry The University Of Tokyo
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Mori Tomohiko
Department Of Chemistry University Of Tokyo
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Abe H
Semiconductor Technology Development Group Semiconductor Solutions Network Company Sony Corporation
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SAIKO Koichiro
Department of Chemistry, University of Tokyo
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Saiko Koichiro
Department Of Chemistry University Of Tokyo
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Abe H
National Res. Inst. Metals(nrim) Ibaraki
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Koma Atsushi
Department Of Applied Physics University Of Tokyo
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Koma Atsushi
Department Of Chemistry University Of Tokyo
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Abe Hideki
Department Of Chemical Pharmaceutical Science Tohoku Pharmaceutical University
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Abe Hideki
National Institute For Materials Science (nims)
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Abe Hideki
Department Of Chemistry University Of Tokyo
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Abe Hideki
Department Of Biological Sciences Graduate School Of Science The University Of Tokyo
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