Decay Rate Plot of Stored Beam Current and Touschek Limit of Current-Lifetime Product
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1986-11-20
著者
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Yamazaki Tetsuo
Elecltrotechnical Laboratory:(present Address) Institute Of Advanced Energy Kyoto University
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MIKADO Tomohisa
Electrotechnical Laboratory
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CHIWAKI Mitsukuni
Elecltrotechnical Laboratory
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MIKADO Tomohisa
National Institute of Advanced Industrial Science and Technology (AIST)
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Sugiyama Shinichi
College Of Engineering Nihon University
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Moriya Tsuyoshi
Institute Of Material Science University Of Tsukuba
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Noguchi T
Sony Corp. Yokohama Jpn
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TOYAMA Masaharu
Toshiba Research and Development Center
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TOMIMASU Takio
Quantum Technology Division, Electrotechnical Laboratory
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YAMAZAKI Tetsuo
Quantum Technology Division, Electrotechnical Laboratory
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MIKADO Tomohisa
Quantum Technology Division, Electrotechnical Laboratory
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SUGIYAMA Suguru
Quantum Technology Division, Electrotechnical Laboratory
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CHIWAKI Mitsukuni
Quantum Technology Division, Electrotechnical Laboratory
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NAKAMURA Takeshi
Quantum Technology Division, Electrotechnical Laboratory
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NOGUCHI Tsutomu
Quantum Technology Division, Electrotechnical Laboratory
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Tomimasu Takio
Electrotechnical Laboratory:(present Address)fel Engineering Corp.
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Tomimasu Takio
Quantum Technology Division Electrotechnical Laboratory
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Mikado T
Electrotechnical Laboratory
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Mikado Tomohisa
Institute Of Materials Science University Of Tsukuba
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Nakamura Takeshi
Quantum Technology Division Electrotechnical Laboratory
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