Acceptors and the Edge Emissions in CdS and ZnSe
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概要
- 論文の詳細を見る
The edge emission in CdS was studied, paying special attention to the acceptors involved. At least seven different excition lines, which are believed to be related with acceptors responsible for the edge emission, were found in the wavelegth region between 4892.6Å and 4876.8Å in various crystals, indicating a wide range of ionization energies of the acceptors. The sample showing two acceptor exciton lines exhibits corresponding edge emissions relevant to these two acceptors. This was confirmed by the observation and analysis of the time-resolved apectra of these edge emissions. The variety of acceptor-bound exciton lines requires prudence for the identification of the chemical nature of the acceptors. Evidence is presented as to similar variety of the edge emission in ZnSe.
- 社団法人日本物理学会の論文
- 1971-07-05
著者
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TOYAMA Masaharu
Toshiba Research and Development Center
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Iida Seishi
Toshiba Research And Development Center Tokyo Shibaura Electric Co. Ltd.
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Toyama Masaharu
Toshiba Research And Development Center Tokyo Shibaura Electric Co. Ltd.
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Toyama Masaharu
Toshiba Central Research Laboratory
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