Emission-Angle Dependence of Electron Transmission through Thick Layers with Initial Energy of 24.8 MeV
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概要
- 論文の詳細を見る
Electrons of 24.8-MeV energy were incident on thick layers of C, AN, Cu, andPb. Energy spectra f (E, 0) of transmitted electrons were measured at angles 0of 0', 5', 15', 30', and 60'. The material thicknesses ranged from xl to x3.6g/cm', or '='10 to '='30% of the continuous slowing-down approximation rangeof the incident electrons in each material. The total number of emerging electronss(0), defined as f f(E, 0)dE, was evaluated for each material. The angular de-pendence of ,s'(2)/.s'(0') is compared with the Moli8re theory of electron multiplescattering including an energy-loss correction, a large-angle correction, and amodification of screening angle. The experimentally obtained .s'(?)/.v(0') relativeto the calculated one increases as 0 increases, and this is more remarkable formaterials of low Z than in the case of high-Z materials.
- 社団法人日本物理学会の論文
- 1984-01-15
著者
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Yamazaki Tetsuo
Elecltrotechnical Laboratory:(present Address) Institute Of Advanced Energy Kyoto University
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MIKADO Tomohisa
Electrotechnical Laboratory
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MIKADO Tomohisa
National Institute of Advanced Industrial Science and Technology (AIST)
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TOMIMASU Takio
Quantum Technology Division, Electrotechnical Laboratory
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YAMAZAKI Tetsuo
Quantum Technology Division, Electrotechnical Laboratory
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MIKADO Tomohisa
Quantum Technology Division, Electrotechnical Laboratory
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Tomimasu Takio
Electrotechnical Laboratory:(present Address)fel Engineering Corp.
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Tomimasu Takio
Quantum Technology Division Electrotechnical Laboratory
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Mikado T
Electrotechnical Laboratory
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Mikado Tomohisa
Institute Of Materials Science University Of Tsukuba
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