Measurements of the Linear Electrooptic Coefficients and Analysis of the Nonlinear Susceptibilities in Cubic GaAs and Hexagonal CdS
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概要
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The unclamped values of the linear electrooptic coefficients r^T_<41> in GaAs and r^T_<33>, r^T_<13>, r^T_c and r^T_<42> in CdS have been measured at the wavelengths of 1.15, 3.39 and 10.6 μm as well as those of the coefficients r^T_c and r^T_<42> in CdS at 0.633 μm. The measured values are as follows: In GaAs r^T_<41> = 1.43±0.07, 1.24±0.04, 1.51±0.05×10^<-12> m/V at 1.15, 3.39 and 10.6 μm respectively. In CdS r^T_<33> = 3.2±0.2, 2.9±0.1, 2.75±0.08×10^<-12> m/V, r^T_<13> = 3.1,±0.2, 3.5±0.1, 2.45±0.08×10^<-12> m/V, r^T_c = 6.2±0.2, 6.5±0.2, 5.2±0.3×10^<-12> m/V, r^T_<42> = 2.0±0.2, 2.0±0.2, 1.7±0.3×10^<-12> m/V at 1.15, 3.39 and 10.6 μm respectively, and r^T_c = 4.8±0.2×10^<-12> m/V, r^T_<42> = 1.6±0.2×10^<-12> m/V at 0.633 μm. Using the measured data and data on nonlinear optical coefficients obtained by others, the anharmonic potential coefficients are determined and the dispersion of the unclamped linear electrooptic coefficients and nonlinear optical coefficients for SHG are calculated.
- 社団法人応用物理学会の論文
- 1976-03-05
著者
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Tada Kunio
Department Of Electronic Engineering Faculty Of Engineering The University Of Tokyo
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SUGIE Mamoru
Department of Electronic Engineering, Faculty of Engineering, University of Tokyo
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Sugie Mamoru
Department Of Electronic Engineering Faculty Of Engineering University Of Tokyo:(present Address) Ce
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Sugie Mamoru
Department Of Electronic Engineering Faculty Of Engineering University Of Tokyo
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Tada Kunio
Department of Electrical and Computer Engineering, Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
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