Comprehensive Study on Reliability of Low-Temperature Poly-Si TFTs under Dynamic CMOS Operations
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概要
- 論文の詳細を見る
- 2001-09-25
著者
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YANO Hiroshi
Graduate School of Materials Science, Nara Institute of Science and Technology
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HATAYAMA Tomoaki
Graduate School of Materials Science, Nara Institute of Science and Technology
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URAOKA Yukiharu
Nara Institute of Science and Technology
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FUYUKI Takashi
Nara Institute of Science and Technology
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Yano H
Graduate School Of Materials Science Nara Institute Of Science And Technology
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YANO Hiroshi
Nara Institute of Science and Technology
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HATAYAMA Tomoaki
Nara Institute of Science and Technology
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Fuyuki Takashi
Nara Inst. Sci. And Technol. Nara Jpn
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