HATAYAMA Tomoaki | Nara Institute of Science and Technology

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概要

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著作論文

Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Crystallization of Double-Layered Silicon Thin Films by Solid Green Laser Annealing
Improvement of Reliability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors by Water Vapor Annealing
High pressure water vapor annealing for improving HfSiO dielectrics properties
Comprehensive Study on Reliability of Low-Temperature Poly-Si TFTs under Dynamic CMOS Operations
Thermal Analysis of Degradation in Ga2O3–In2O3–ZnO Thin-Film Transistors
Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide
Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Low Temperature Polycrystalline Silicon Thin Film Transistors Flash Memory with Silicon Nanocrystal Dot
Improvement of Reliability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors by Water Vapor Annealing
Low-temperature Polycrystalline Silicon Thin Film Transistor Flash Memory with Ferritin
Crystallinity Evaluation by Microwave Photoconductivity Decay in Double-Layered Polycrystalline Silicon Thin Films Crystallized by Solid Green Laser Annealing

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