Yano H | Graduate School Of Materials Science Nara Institute Of Science And Technology

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概要

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著作論文

Investigation of Near-Interface Traps Generated by NO Direct Oxidation in C-face 4H-SiC Metal-Oxide-Semiconductor Structures
Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Crystallization of Double-Layered Silicon Thin Films by Solid Green Laser Annealing
Crystallinity evaluation by microwave photoconductivity decay in double-layered polycrystalline silicon thin films crystallized by solid green laser annealing
Low temperature polycrystalline silicon thin film transistors flash memory with silicon nanocrystal dot
Reliability of low temperature polycrystalline silicon thin-film transistors with ultrathin gate oxide
Evaluation of Crystallinity in 4H-SiC{0001} Epilayers Thermally Etched by Chlorine and Oxygen System
Improvement of Reliability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors by Water Vapor Annealing
Floating Nanodot Gate Memory Devices Based on Biomineralized Inorganic Nanodot Array as a Storage Node
Analysis of Photoelectrochemical Processes in α-SiC Substrates with Atomically Flat Surfaces
Electron Injection into Si Nanodot Fabricated by Side-Wall Plasma Enhanced Chemical Vapor Deposition
Fabrication of Anodic Oxidation Films on 4H-SiC at Room Temperature Using HNO_3-Based Electrolytes
Role of Hydrogen in Dry Etching of Silicon Carbide Using Inductively and Capacitively Coupled Plasma
High pressure water vapor annealing for improving HfSiO dielectrics properties
Degradation in Low-Temperature Poly-Si Thin Film Transistors Depending on Grain Boundaries
Gate Length Dependence of Hot Carrier Reliability in Low-Temperature Polycrystatline-Silicon P-Channel Thin Film Transistors
Low Temperature Nitridation of Si Oxide Utilizing Activated Nitrogen(Semiconductors)
Comprehensive Study on Reliability of Low-Temperature Poly-Si Thin-Film Transistors under Dynamic Complimentary Metal-Oxide Semiconductor Operations
Hot Carrier Effect in Low-Temperature poly-Si p-ch Thin-Film Transistors under Dynamic Stress : Semiconductors
Comprehensive Study on Reliability of Low-Temperature Poly-Si TFTs under Dynamic CMOS Operations

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