FUYUKI Takashi | Nara Institute of Science and Technology

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Reduction of a Ferritin Core Embedded in Silicon Oxide Film for An Application to Floating Gate Memory
Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Crystallization of Double-Layered Silicon Thin Films by Solid Green Laser Annealing
Improvement of Reliability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors by Water Vapor Annealing
Electron Injection into Si Nanodot Fabricated by Side-Wall Plasma Enhanced Chemical Vapor Deposition
High pressure water vapor annealing for improving HfSiO dielectrics properties
Gate Length Dependence of Hot Carrier Reliability in Low-Temperature Polycrystatline-Silicon P-Channel Thin Film Transistors
Low Temperature Nitridation of Si Oxide Utilizing Activated Nitrogen(Semiconductors)
Comprehensive Study on Reliability of Low-Temperature Poly-Si Thin-Film Transistors under Dynamic Complimentary Metal-Oxide Semiconductor Operations
Hot Carrier Effect in Low-Temperature poly-Si p-ch Thin-Film Transistors under Dynamic Stress : Semiconductors
Comprehensive Study on Reliability of Low-Temperature Poly-Si TFTs under Dynamic CMOS Operations
Floating Gate MOS Capacitor with High-Density Nanodots Array Produced by Protein Supramolecule
Enhancement of crystal growth rate of Bio-Nano Crystallization by Pulsed Rapid Thermal Annealing
High-Density Floating Nanodots Memory Produced by Cage-Shaped Protein
Fabrication of Defect-Free Sub-10nm Si Nanocolumn for Quantum Effect Devices Using Cl Neutral Beam Process
Suppression of Self-Heating in Low-Temperature Polycrystalline Silicon Thin-Film Transitors
Analysis of Device Performance by Quasi Three-Dimensional Simulation for Thin Film Polycrystalline Silicon Solar Cells with Columnar Structure : Semiconductors
Optimum Designing of Single Crystalline Silicon Thin Film Solar Cells with Graded Active Layer : Semiconductors
Reliability of High-Frequency Operation of Low-Temperature Polysilicon Thin Film Transistors under Dynamic Stress
Electrical Properties and Thermal Stability of Cu/6H-SiC Junctions : Electrical Properties of Condensed Matter

もっと見る

スポンサーリンク