Thermally Stimulated Current Maeasurement for Degraded Pb(Ti,Zr)O_3 Thin-Film Capacitors
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-09-30
著者
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Nishida T
Nara Inst. Sci. And Technol. Nara Jpn
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NISHIDA Takashi
Graduate School of Materials Science, Nara Institute of Science and Technology
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SHIOSAKI Tadashi
Graduate School of Materials Science, Nara Institute of Science and Technology
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OKAMURA Soichiro
Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST)
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MATSUOKA Masahiro
Graduate School of Materials Science, Nara Institute of Science and Technology
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Okamura Soichiro
Department Of Applied Physics Faculty Of Science Science University Of Tokyo
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Nishida Toshio
Ntt Basic Research Laboratories Physical Science Laboratory
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Shiosaki Tadashi
Research Development Division Sakai Chemical Industry Co. Ltd.
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