Investigation on Thickness Effect of Ultrathin Vinylidene Fluoride/Trifluoroethylene Copolymer Films
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概要
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We investigated the thickness effect on ferroelectric properties of vinylidene fluoride (VDF)/trifluoroethylene (TrFE) copolymer films in the region of 9.7--230 nm. Film thickness was estimated from cross-sectional transmission electron microscope (TEM) images. Relative permittivity calculated using precise thickness measurements decreased from 10 to 5.3 with decreasing thickness. Remnant polarization gradually decreased from 80 to 34 mC/m2 with decreasing thickness, whereas maximum polarization was almost constant. These results suggested the existence of a dead layer with a low permittivity at the interface between the VDF/TrFE copolymer films and electrodes. Finally, the thickness of the dead layer was estimated to be 4.1 nm by assuming the existence of two layers with different permittivities.
- 2011-09-25
著者
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Evans James
Department Of Materials Science And Mineral Engineering University Of California
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Browning Nigel
Department Of Physics (m/c 273) University Of Illinois At Chicago
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Okamura Soichiro
Department Of Applied Physics Faculty Of Science Science University Of Tokyo
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Nakajima Takashi
Department Network And Computer Engineering School Of Information And Design Engineering Tokai Unive
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MABUCHI Yuichiro
Department of Applied Physics, Faculty of Science, Tokyo University of Science
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Evans James
Department of Molecular and Cellular Biology, University of California, Davis, CA 95616, U.S.A.
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Chaudhuri Kaustav
Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616, U.S.A.
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Nakajima Takashi
Department of Applied Physics, Faculty of Science, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan
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Okamura Soichiro
Department of Applied Physics, Faculty of Science, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan
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Browning Nigel
Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616, U.S.A.
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Mabuchi Yuichiro
Department of Applied Physics, Faculty of Science, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan
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