Bi系超伝導テープの高分解能Zコントラスト像観察

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概要

• 論文の詳細を見る
• 2000-05-01

著者

• Browning Nigel

  Department Of Physics (m/c 273) University Of Illinois At Chicago

• 岸田 恭輔

  金材技研

• BROWNING N.D.

  Dept. of Physics, Univ. of Illinois at Chicago

• Browning N

  Univ. Illinois At Chicago Il Usa

• Browning N.d.

  Dept. Of Physics Univ. Of Illinois At Chicago

関連論文

• Bi系超伝導テープの高分解能Zコントラスト像観察
• Application of atomic scale STEM techniques to the study of interfaces and defects in materials
• Atomic resolution Z-contrast imaging of semiconductors
• Demonstration of atomic resolution Z-contrast imaging by a JEOL JEM-2010F scanning transmission electron microscope
• Investigation on Thickness Effect of Ultrathin Vinylidene Fluoride/Trifluoroethylene Copolymer Films

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