Matsuura Hideharu | Department Of Electronic Engineering And Computer Science Osaka Electro-communication University
スポンサーリンク
概要
- 同名の論文著者
- Department Of Electronic Engineering And Computer Science Osaka Electro-communication Universityの論文著者
関連著者
-
Matsuura Hideharu
Department Of Electronic Engineering And Computer Science Osaka Electro-communication University
-
MATSUURA Hideharu
Department of Electronics, Osaka Electro-Communication University
-
MATSUNAMI Hiroyuki
Department of Electronic Science & Engineering, Kyoto University
-
Matsunami Hiroyuki
Department Of Eectrical Engineering Kyoto University
-
Matsunami Hiroyuki
Department Of Electrical Engineering Kyoto University
-
Matsuura Hiroto
College Of Engineering University Of Osaka Prefecture
-
Matsunami H
Kyoto Univ. Kyoto Jpn
-
YOSHIMOTO Masahiro
Department of Electrical Engineering, Kyoto University
-
Segawa Kazushige
Department Of Electronics Osaka Electro-communication University
-
Yoshimoto Masahiro
Department Of Electronic Science And Engineering Faculty Of Engineering Kyoto University
-
Yoshimoto Masahiro
Department Of Electronic Science And Engineering Kyoto University
-
Yoshimoto Masahiro
Department Of Electrical Engineering Kyoto University
-
Yoshimoto M
Materials And Structures Laboratory Tokyo Institute Of Technology
-
Yoshimoto M
Kyoto Inst. Technol. Kyoto Jpn
-
Yoshimoto Masahiro
Department of Innovative and Engineered Materials, Tokyo Institute of Technology
-
NISHINO Shigehiro
Department of Electronics and Information Science, Kyoto Institute of Technology
-
Takahashi Miyuki
Department Of Biochemistry And Cell Biology National Institute Of Health
-
Nishida Katsuhiko
Eniwa Research And Development Center Kyoto Semiconductor Corporation
-
Nishino Shigehiro
Department Of Electrical Engineering Kyoto University
-
Matsuda Sumio
National Space Development Agency Of Japan
-
Susaki Wataru
Department Of Electronic Engineering And Computer Science Osaka Electro-communication University
-
Segawa Masaharu
Department Of Electronic Engineering And Computer Science Osaka Electro-communication University
-
Nishikawa Kazuhiro
Department Of Electronic Engineering And Computer Science Osaka Electro-communication University
-
Ohshima Takeshi
Japan Atomic Energy Agency
-
Kagamihara Sou
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Inoue Yuuki
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Takahashi Miyuki
Department of Applied Science, Faculty of Technology, Tokyo Denki University
-
KIMOTO Tsunenobu
Department of Electronic Science and Engineering, Kyoto University
-
CHEN Yi
Department of Chemistry, Nanjing University
-
Taniguchi Kazuo
Department of Pediatrics, Nihon University School of Medicine
-
Fujii Hisao
Department of Endoscopy and Ultrasound, Nara Medical University
-
Itoh Hisayoshi
Japan Atomic Energy Agency
-
Imai Takahiro
Itami Research Laboratories Sumitomo Electric Industries Ltd.
-
MATSUDA Sumio
National Space Development Agency of Japan (NASDA)
-
AKATANI Kenji
Department of Electronics, Osaka Electro-Communication University
-
UEDA Michihisa
Department of Electronics, Osaka Electro-Communication University
-
SEGAWA Kazushige
Department of Electronics, Osaka Electro-Communication University
-
TOMOZAWA Hidemasa
Eniwa Research and Development Center, Kyoto Semiconductor Corporation
-
Akatani Kenji
Department Of Electronics Osaka Electro-communication University
-
Ueda Michihisa
Department Of Electronics Osaka Electro-communication University
-
HISAMATSU Tadashi
National Space Development Agency of Japan
-
Masuda Yoshitake
Nagoya University Graduate School Of Engineering Department Of Applied Chemistry
-
Nishino Shigehiro
Department Of Electrical Engineering Technical College Kyoto Institute Of Technology
-
Nishino Shigehiro
Department Of Electronics Kyoto University
-
Tomozawa Hidemasa
Research Center For Interface Quantum Electronics And Graduate School Of Electronics And Information
-
Tomozawa Hidemasa
Eniwa Research And Development Center Kyoto Semiconductor Corporation
-
Chen Y
Department Of Electronic Science And Engineering Kyoto University
-
MASUDA Yasuichi
Department of Electronics and Information Science, Kyoto Institute of Technology
-
Kimoto Tsunenobu
Department Of Electronics Science And Engineering Kyoto University
-
Kimoto Tsunenobu
Department Of Electrical Engineering Faculty Of Engineering Kyoto University
-
Taniguchi Kazuo
Department Of Materials Science Osaka Electro-communication University
-
Taniguchi Kazuo
Department Of A Nesthesiology Oita Medical University
-
Masuda Y
Department Of Electronic Intelligence And Systems Hachinohe Institute Of Technology
-
Fujii Hisao
Department Of Electronics Kyoto University
-
Imai Hideaki
Department Of Electronic And Information Engineering Faculty Of Engineering Hokkaido University
-
Takai Hitoshi
Department Of Electronics Kyoto University
-
Nishino S
Kyoto Inst. Technol. Kyoto Jpn
-
Nishida K
Eniwa Research And Development Center Kyoto Semiconductor Corporation
-
Miyake Takayuki
Department Of Cardiology Sekishinkai Sayama Hospital
-
NISHIKAWA KAZUHIRO
Department of Surgery, Osaka General Medical Center
-
MORITA Kouhei
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University
-
MIZUKOSHI Takeo
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University
-
SEGAWA Masaharu
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University
-
SUSAKI Wataru
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University
-
Masuda Yasuichi
Department Of Electronics And Information Science Kyoto Institute Of Technology
-
UCHIDA Yoshitsugu
Osaka Branch, Tokyo Technica Co.
-
Morita Kouhei
General R&d Laboratories Taiyo Yuden Co. Ltd.
-
Mizukoshi Takeo
Department Of Electronic Engineering And Computer Science Osaka Electro-communication University
-
Masuda Y
Human Ecology Research Center Sanyo Electric Co. Ltd.
-
Inoue Yuuki
Department Of Preventive Veterinary Medicine And Animal Health Nihon University School Of Veterinary
-
Uchida Yoshitsugu
Osaka Branch Tokyo Technica Co.
-
Chen Yi
Department Of Chemistry And Biochemistry Graduate School Of Engineering Kyushu University
-
Sonoi Kazuhide
Department Of Electronics Osaka Electro-communication University
-
Matsunami Hiroyuki
Department Of Electronics Science And Engineering Kyoto University
-
Matsuura H
Department Of Electronics Osaka Electro-communication University
-
Matsuura Hideharu
Department Of Electronics Osaka Electro-communication University
-
Matsuura Hideharu
Department Of Electronics Kyoto University
-
Morita Kouhei
Department Of Diagnostic Pathology Nara Medical University School Of Medicine
-
EBISUI Tatsuya
Department of Electronics, Osaka Electro-Communication University
-
Ebisui T
Tokushima Univ. Tokushima Jpn
-
Morita Kouhei
Department Of Diagnostic Pathology Nara Medical University
-
Ishida Takuya
Department Of Biomaterial Sciences Graduate School Of Agricultural And Life Sciences The University Of Tokyo
-
Matsuura Hideharu
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Matsuura Hideharu
Department of Electronics, Osaka Electro-Communication University, 18–8 Hatsu-cho, Neyagawa, Osaka 572, Japan
-
Matsunami Hiroyuki
Department of Electronic Science and Engineering, Kyoto University
-
Kawakita Shirou
Japan Aerospace Exploration Agency, 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505, Japan
-
Kawakita Shirou
Japan Aerospace Exploration Agency (JAXA), 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505, Japan
-
Imai Hideaki
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Iwata Hirofumi
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Ishihara Ryohei
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Komeda Masahiko
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Kikuta Masanori
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Hisamatsu Tadashi
Sharp Corporation, 492 Minosho-cho, Yamato-Koriyama, Nara 639-1186, Japan
-
Itoh Hisayoshi
Japan Atomic Energy Agency, 1233 Watanuki-machi, Takasaki, Gunma 370-1292, Japan
-
Nishikawa Kazuhiro
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Takebe Toshihiko
Itami Research Laboratory, Sumitomo Electric Industries, Ltd., 1-1, Koyakita 1-choume, Itami, Hyogo 664-0016, Japan
-
Ishida Takuya
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Kirihataya Taishi
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Anzawa Osamu
National Space Development Agency of Japan, 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505, Japan
-
Ohshima Takeshi
Japan Atomic Energy Agency, 1233 Watanuki-machi, Takasaki, Gunma 370-1292, Japan
-
Namba Akihiko
Itami Research Laboratory, Sumitomo Electric Industries, Ltd., 1-1, Koyakita 1-choume, Itami, Hyogo 664-0016, Japan
-
Takahashi Miyuki
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Morizono Tatsuya
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Kagawa Yoshitaka
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Tano Shoichi
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Yanase Hirokazu
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Izawa Keisuke
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Minohara Nobumasa
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Miyake Takayuki
Department of Electronic Engineering and Computer Science, Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530, Japan
-
Imai Takahiro
Itami Laboratory, Sumitomo Electric Industries, Ltd., 1-1-1, Koyakita, Itami, Hyogo 664
-
Imai Hideaki
Department of Applied Chemistry, Faculty of Engineering, Nagoya University
-
Ueda Michihisa
Department of Chemistry, Faculty of Science, Osaka City University
著作論文
- A New N-Channel Junction Field-Effect Transistor Embedded in the i Layer of a Pin Diode
- Determination of Donor Densities and Donor Levels in 3C-SiC Grown from Si_2(CH_3)_6 Using Hall-Effect Measurements
- Nitrogen Donor Concentrations and Its Energy Levels in 4H-SiC Uniquely Determined by a New Graphical Method Based on Hall-Effect Measurement
- Interface Electronic Properties between Silicon and Silicon Nitride Deposited by Direct Photochemical Vapor Deposition
- Increase of Leakage Current and Trap Density Caused by Bias Stress in Silicon Nitride Prepared by Photo-Chemical Vapor Deposition
- Discharging Current Transient Spectroscopy for Evaluating Traps in Insulators
- Acceptor Densities and Acceptor Levels in Undoped GaSb Determined by Free Carrier Concentration Spectroscopy
- Characteristics of Silicon Inversion Layer Solar Cells : II-2: SILICON SOLAR CELLS (3)
- Evaluation of Hole Traps in 10-MeV Proton-Irradiated p-Type Silicon from Hall-Effect Measurements
- Fundamental Properties of MIS Solar Cells Using Mg-p Si System : I-2: SINGLE CRYSTAL SILICON SOLAR CELLS
- A New Structure of an N-Channel Junction Field-Effect Transistor Embedded in a Pin Diode for an X-Ray Detector
- Effect of Intrinsic Defects in High-Purity Semi-Insulating 4H-SiC on Reverse Current–Voltage Characteristics of Schottky Barrier Diodes
- Accurate Determination of Acceptor Densities and Acceptor Levels in Undoped InGaSb from Temperature Dependence of Hole Concentration
- Si Substrate Suitable for Radiation-Resistant Space Solar Cells
- A Simple Graphical Method for Determining Densities and Energy Levels of Donors and Acceptors in Semiconductor from Temperature Dependence of Majority Carrier Concentration
- Accurate Determination of Density and Energy Level of B Acceptor in Diamond from Temperature Dependence of Hole Concentration
- Investigation of Transient Reverse Currents in X-Ray Detector Pin Diodes by Discharge Current Transient Spectroscopy
- Difference between Traps Determined from Transient Capacitance and Transient Reverse Current
- An Improved Method for Determining Densities and Energy Levels of Dopants and Traps by Means of Hall-Effect Measurement
- A Simple Graphical Method for Evaluating Dipole Relaxation Time in Dielectric
- Evaluation of Densities and Energy Levels of Donors and Acceptors in Compensated Semiconductor from Temperature Dependence of Majority Carrier Concentration
- A Simple Graphic Method for Evaluating Densities and Energy Levels of Impurities in Semiconductor from Temperature Dependence of Majority-Carrier Concentration
- Annealing Behavior of Donorlike Defects Induced by High-Fluence Irradiation of High-Energy Particles in p-Type Silicon
- Characterization of Intrinsic Defects in High-Purity High-Resistivity p-Type 6H-SiC
- Mechanisms of Reduction in Hole Concentration in Al-Implanted p-Type 6H-SiC by 1 MeV Electron Irradiation
- Evaluating Polarization in Dielectrics with Continuously Distributed Dipole Relaxation Time by Discharge Current Transient Spectroscopy