Investigation of Transient Reverse Currents in X-Ray Detector Pin Diodes by Discharge Current Transient Spectroscopy
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概要
- 論文の詳細を見る
Transient reverse currents flow in X-ray detector diodes when a high reverse bias (operating voltage) is suddenly applied from 0 V, which leads to problems in the X-ray measurements. Discharge current transient spectroscopy (DCTS) was applied to determine the densities, energy levels and capture cross sections of traps related to the transient reverse currents in the diodes. DCTS analysis revealed one type of trap with E_C-0.54 eV in our silicon pin diodes, where E_C is the energy level at the bottom of the conduction band.
- 社団法人応用物理学会の論文
- 2000-01-15
著者
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Segawa Kazushige
Department Of Electronics Osaka Electro-communication University
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Matsuura Hideharu
Department Of Electronic Engineering And Computer Science Osaka Electro-communication University
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