Lee Jung-ho | Memory R&d Division Hynix Semiconductor Inc.
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概要
関連著者
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Lee Jung-ho
Memory R&d Division Hynix Semiconductor Inc.
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Lee J‐h
Memory R&d Division Hynix Semiconductor Inc.
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Cho Heung-jae
Memory R&d Division Hynix Semiconductor Inc.
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Lim Kwan-yong
Memory R&d Division Hynix Semiconductor Inc.
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Yang Hong-seon
Memory R&d Division Hynix Semiconductor Inc.
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Oh Jae-geun
Memory R&d Division Hynix Semiconductor Inc.
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Sohn Hyun-chul
Memory R&d Division Hynix Semiconductor Inc.
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Cho Heung-jae
Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.
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Jang S‐a
Memory R&d Division Hynix Semiconductor Inc.
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Jang Se-aug
Memory R&d Division Hyundai Electronics Ind. Co. Ltd.
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Jang Se-aug
Memory R&d Division Hynix Semiconductor Inc.
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Kim Yang
Department Of Material Science And Engineering Kaist
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KIM Yong
Memory R&D Division, Hynix Semiconductor Inc.
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Jang Se-aug
R&d Division Hynix Semiconductor Inc.
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Kim Yong
Memory R&d Division Hynix Semiconductor Inc.
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Yoon H‐k
Korea Advanced Inst. Of Sci. And Technol. Daejon Kor
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LEE Jung-Ho
Memory R&D Division, Hynix Semiconductor Inc.
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SOHN Hyun-Chul
Memory R&D Division, Hynix Semiconductor Inc.
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Sohn H‐c
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Kim Jin-woong
Memory R&d Division Hynix Semiconductor Inc.
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JEONG Jaehwa
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
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LEE Jun-Hee
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
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YOON Hyoung-Kil
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
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GWEON Dae-Gab
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
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Yang Jun-mo
Memory R&d Division Hynix Semiconductor Inc.
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SEO Chang-Taeg
Department of Electronics, Kyungpook National University
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LEE Jong-Hyun
Department of Electronics, Kyungpook National University
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Back Tae-sun
Memory Research And Development Division Hynix Semiconductor Inc
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Back Tae-sun
Memory R&d Division Hynix Semiconductor Inc.
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Park Tae-su
Memory R&d Division Hynix Semiconductor Inc.
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Yeo In-seok
Memory R&d Division Hynix Semiconductor Inc.
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Lee Jong-hyun
Department Of Electronics Kyungpook National University
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Lim Kwan-yong
Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.
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Hong Byung-seop
Memory R&d Division Hynix Semiconductor Inc.
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Cho Hag-ju
Process Development Team Semiconductor R&d Center Samsung Electronics Co. Ltd
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Yeo In-seok
Memory R&d Division Hyundai Electronics Industries Co.ltd.
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Yeo In-seok
Memory R&d Division Hyundai Electronics Industries Co.ltd
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Park Dae-gyu
Memory R&d Division Hynix Semiconductor Inc.
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Kim Chung-tae
Memory R & D Division Hyundai Electronics Industries Co. Ltd.
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Roh Jae-sung
Memory R&d Division Hynix Semiconductor Inc.
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SHIN Jang-Kyoo
Department of Electronics, Kyungpook National University
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KIM Young-Min
Department of Electronics, Kyungpook National University
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Han Min-Koo
School of Electrical Engineering, Seoul National University
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KIM Jin
Memory R&D Division, Hynix Semiconductor Inc.
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LEE Jung-Ho
Department of Materials and Chemical Engineering, Hanyang University
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Kim Young-min
Graduate School Of Agriculture Hokkaido University
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Seo Chang-taeg
Department Of Electronics Kyungpook National University
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Kim Chung-tae
Memory R&d Division Hyundai Electronics Industries Co.ltd.
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Kim Tae-yoon
Memory R&d Division Hynix Semiconductor Inc.
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Park J‐h
Chonbuk National Univ. Medical School Chonju Kor
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Shin Jang-kyoo
Department Of Electronics Kyungpook National University
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Lee Jung-ho
Memory R&d Division Hyundai Electronics Industries Co.ltd.
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Lee Jung-ho
Department Of Civil Engineering Kangwon National University
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SUNG Min
Memory R&D Division, Hynix Semiconductor Inc.
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LEE Seung
Memory R&D Division, Hynix Semiconductor Inc.
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JOO Moon-Sig
Memory R&D Division, Hynix Semiconductor Inc.
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LEE Ju-Hee
Memory R&D Division, Hynix Semiconductor Inc.
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PYI Seung-Ho
Memory R&D Division, Hynix Semiconductor Inc.
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HONG Byung-Seop
Memory R&D Division, Hynix Semiconductor Inc.
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KIM Young-Min
Special Business Division, Koreaabrasive Ind. Co., Ltd.
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YOON Ho-Cheol
Special Business Division, Koreaabrasive Ind. Co., Ltd.
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Pyi Seung-ho
Memory R&d Division Hynix Semiconductor Inc.
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Pyi Seung-ho
Memory R&d Div. Hyundai Electronics Ind. Co. Ltd.
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Joo Moon-sig
Memory R&d Division Hynix Semiconductor Inc.
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Kim Jin
Memory R&d Division Hynix Semiconductor Inc.
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Yi Dong-young
Department Of Electrical Engineering Uiduk University
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Lee Jeong-youb
Memory R&d Division Hynix Semiconductor Inc.
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OH Hyeong-Ryeol
Han-yang University
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LEE Moon
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
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KWON Yoon-Hyeok
School of Electrical Engineering, Seoul National University
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HWANGBO Seung
Department of Photoelectronic Engineering, Honam University
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LEE June-Ho
School of Electrical Engineering, Hoseo University
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Kim D‐h
Gyeongsang National Univ. Chinju Kor
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Park Ji-hyun
Department Of Surgery Seoul National University College Of Medicine
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Yoon Ho-cheol
Special Business Division Koreaabrasive Ind. Co. Ltd.
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Kim Young-min
Hokkaido Univ.
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KIM Duk-hyun
Korea Composites
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HAN Bong-Koo
Professeor, Seoul National University of Technology
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PARK Ji-Hyun
Graduate Student, Seoul National University of Technology
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Kim Young-min
Hokkaido University
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Kim Young-min
Special Business Division Koreaabrasive Ind. Co. Ltd.
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Han Bong-koo
Professeor Seoul National University Of Technology
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KWAK Heung-Sik
Memory R&D Division, HYUNDAI Electronics Industries Co.Ltd.
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Kwak Heung-sik
Memory R&d Division Hyundai Electronics Industries Co.ltd.
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Sung Min
Memory R&d Division Hynix Semiconductor Inc.
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Lee Seung
Memory R&d Division Hynix Semiconductor Inc.
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Kim Jin
Memory Division Samsung Electronics Corporation
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Sohn Hyun-Chul
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Oh Jae-Geun
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Lee Jeong-Youb
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Lee Ju-Hee
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Cho Heung-Jae
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Roh Jae-Sung
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Lee Jung-Ho
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Yeo In-Seok
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Park Dae-Gyu
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Hong Byung-Seop
Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea
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Lee Jung-Ho
Department of Chemical Engineering, Hanyang University, Ansan, Gyeonggi 426-791, Republic of Korea
著作論文
- A Novel Comb-Type Differential Pressure Sensor with Silicon Beams Embedded in a Silicone Rubber Membrane
- Diffusion Barrier Characteristics of TiSix/TiN for Tungsten Dual Poly Gate in DRAM
- Degradation of Nitride/W/WN_x/Poly-Si Gate Stack by Post-Thermal Processes
- Effect of Post Thermal Processes on Nitride/W/WN_x/poly-Si Gate Stack
- Impact of In Situ NH_3 Preannealing on Sub-100nm Tungsten Polymetal Gate Electrode during the Sealing Nitride Formation
- Effect of Selective Oxidation Conditions on Defect Generation in Gate Oxide
- Fabrication of Micro Probe Beam Using MEMS Technology for New Vertical Silicon Probe Card
- Experimental Verification of Autoalignment for Focusing Unit of Near Field Recording System: Neural Network Approach (Special Issue: Optical Memories)
- Thickness Minimized Magnetic Circuit for Rotary-Type Voice Coil Motor
- A Neural Network Approach Based on Interference Pattern Analysis : Application to an Autoalignment Method for the Focusing Unit of NFR System
- Multisegmented Magnet Array on Voice Coil Motor in Rotating Data Storage Devices
- The Space Charge Effect on the Discharge Current in Cross-Linked Polyethylene under High AC Voltages
- Vibration Analysis of Three Span Continuous Reinforced Concrete Bridge with Elastic Intermeidate Supports II
- Impacts of Self-Aligned Epitaxial Silicon Sliver(SESS)in Buried Channel-pFETs Elevated Source/Drain Using Dual-Spacer Structure
- Effect of Selective Oxidation Conditions on Defect Generation in Gate Oxide
- Impact of In Situ NH3 Preannealing on Sub-100 nm Tungsten Polymetal Gate Electrode during the Sealing Nitride Formation
- Characteristics of Multiple Thickness Gate Oxides Using Oxidation Enhancement by Si Implantation