Park Tae-su | Memory R&d Division Hynix Semiconductor Inc.
スポンサーリンク
概要
関連著者
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Park Tae-su
Memory R&d Division Hynix Semiconductor Inc.
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Yang Jun-mo
Memory R&d Division Hynix Semiconductor Inc.
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Jang S‐a
Memory R&d Division Hynix Semiconductor Inc.
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Jang Se-aug
R&d Division Hynix Semiconductor Inc.
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Cho Heung-jae
Memory R&d Division Hynix Semiconductor Inc.
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Kim Jin-woong
Memory R&d Division Hynix Semiconductor Inc.
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Yeo In-seok
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Cho Heung-jae
Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.
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Lim Kwan-yong
Memory R&d Division Hynix Semiconductor Inc.
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Yang Hong-seon
Memory R&d Division Hynix Semiconductor Inc.
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Roh J‐s
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Roh Jae-sung
Advanced Process-capacitor Memory Research & Development Division Hyundai Electronics Industries
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Yeo I‐s
Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.
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LEE Jung-Ho
Memory R&D Division, Hynix Semiconductor Inc.
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Oh Jae-geun
Memory R&d Division Hynix Semiconductor Inc.
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Back Tae-sun
Memory Research And Development Division Hynix Semiconductor Inc
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Back Tae-sun
Memory R&d Division Hynix Semiconductor Inc.
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Jang Se-aug
Memory R&d Division Hyundai Electronics Ind. Co. Ltd.
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Jang Se-aug
Memory R&d Division Hynix Semiconductor Inc.
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Kim Tae-kyun
Occupational Safety And Health Research Institute Korea Occupational Safety And Health Agency
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Kim Tae-kyun
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Kim Yang
Department Of Material Science And Engineering Kaist
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Hwang J‐m
Hyundai Microelectronics Co. Cheongju Kor
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Hwang Jeong-mo
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Hwang Jeong-mo
R&d Division Lg Semicon Co. Ltd.
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Hwang Jeong-mo
R&d Division Hyundai Microelectronics Co.
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Lee Jung-ho
Memory R&d Division Hynix Semiconductor Inc.
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KIM Yong
Memory R&D Division, Hynix Semiconductor Inc.
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SOHN Hyun-Chul
Memory R&D Division, Hynix Semiconductor Inc.
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Sohn H‐c
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Sohn Hyun-chul
Memory R&d Division Hynix Semiconductor Inc.
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Lee J‐h
Memory R&d Division Hynix Semiconductor Inc.
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Jang Se-Aug
HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
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Yang Jun-Mo
HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
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Park Tae-Su
HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
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Roh Jae-Sung
HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
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Hwang Jeong-mo
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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Hwang J.-m.
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Roh J‐s
Memory Research And Development Division Hynix Semiconductor Inc.
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Kim Yong
Memory R&d Division Hynix Semiconductor Inc.
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Lee S‐y
Yonsei Univ. Seoul Kor
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Lim Kwan-yong
Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.
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Yang J‐m
Memory R&d Division Hynix Semiconductor Inc.
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Yang J‐m
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Cho Hag-ju
Process Development Team Semiconductor R&d Center Samsung Electronics Co. Ltd
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Park Ju-chul
Memory Research And Development Division Hynix Semiconductor Inc.
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Park Tae-su
Memory Research And Development Division Hynix Semiconductor Inc.
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Lee Jong-pill
Memory Research And Development Division Hynix Semiconductor Inc.
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EO Hee-Joo
Memory Research and Development Division, Hynix Semiconductor Inc.
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KIM Won
Memory Research and Development Division, Hynix Semiconductor Inc.
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LEE Soun-Young
Memory Research and Development Division, Hynix Semiconductor Inc.
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Park Ju-chul
Analysis Team Memory R&d Division Hynix Semiconductor Inc.
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Eo Hee-joo
Memory Research And Development Division Hynix Semiconductor Inc.
著作論文
- Degradation of Nitride/W/WN_x/Poly-Si Gate Stack by Post-Thermal Processes
- Effect of Post Thermal Processes on Nitride/W/WN_x/poly-Si Gate Stack
- ED2000-50 / SDM2000-50 Oxidation Behaviors of Ti-Polycide Gate Stack During Gate Re-oxidation
- ED2000-50 / SDM2000-50 Oxidation Behaviors of Ti-Polycide Gate Stack During Gate Re-oxidation
- Chemical junction delineation of a specific site in Si devices