Jang Se-Aug | HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
スポンサーリンク
概要
関連著者
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Yeo In-seok
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Yang Jun-mo
Memory R&d Division Hynix Semiconductor Inc.
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Roh J‐s
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Roh Jae-sung
Advanced Process-capacitor Memory Research & Development Division Hyundai Electronics Industries
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Yeo I‐s
Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.
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Jang S‐a
Memory R&d Division Hynix Semiconductor Inc.
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Park Tae-su
Memory R&d Division Hynix Semiconductor Inc.
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Kim Tae-kyun
Occupational Safety And Health Research Institute Korea Occupational Safety And Health Agency
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Kim Tae-kyun
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Hwang J‐m
Hyundai Microelectronics Co. Cheongju Kor
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Hwang Jeong-mo
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Hwang Jeong-mo
R&d Division Lg Semicon Co. Ltd.
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Hwang Jeong-mo
R&d Division Hyundai Microelectronics Co.
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Jang Se-Aug
HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
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Yang Jun-Mo
HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
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Park Tae-Su
HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
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Roh Jae-Sung
HYUNDAI Electronics Industries Co. Ltd., Memory R&D Division
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Hwang Jeong-mo
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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Hwang J.-m.
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Roh J‐s
Memory Research And Development Division Hynix Semiconductor Inc.
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Jang Se-aug
R&d Division Hynix Semiconductor Inc.
著作論文
- ED2000-50 / SDM2000-50 Oxidation Behaviors of Ti-Polycide Gate Stack During Gate Re-oxidation
- ED2000-50 / SDM2000-50 Oxidation Behaviors of Ti-Polycide Gate Stack During Gate Re-oxidation