HONG Byung-Seop | Memory R&D Division, Hynix Semiconductor Inc.

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概要

• 同名の論文著者
• Memory R&D Division, Hynix Semiconductor Inc.の論文著者

関連著者

• Cho Heung-jae

  Memory R&d Division Hynix Semiconductor Inc.

• Cho Heung-jae

  Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.

• Lim Kwan-yong

  Memory R&d Division Hynix Semiconductor Inc.

• Yang Hong-seon

  Memory R&d Division Hynix Semiconductor Inc.

• LEE Jung-Ho

  Memory R&D Division, Hynix Semiconductor Inc.

• Oh Jae-geun

  Memory R&d Division Hynix Semiconductor Inc.

• Jang S‐a

  Memory R&d Division Hynix Semiconductor Inc.

• Jang Se-aug

  Memory R&d Division Hyundai Electronics Ind. Co. Ltd.

• Kim Yang

  Department Of Material Science And Engineering Kaist

• Lee Jung-ho

  Memory R&d Division Hynix Semiconductor Inc.

• KIM Yong

  Memory R&D Division, Hynix Semiconductor Inc.

• SOHN Hyun-Chul

  Memory R&D Division, Hynix Semiconductor Inc.

• HONG Byung-Seop

  Memory R&D Division, Hynix Semiconductor Inc.

• Hong Byung-seop

  Memory R&d Division Hynix Semiconductor Inc.

• Sohn H‐c

  Hynix Semiconductor Inc. Kyoungki‐do Kor

• Sohn Hyun-chul

  Memory R&d Division Hynix Semiconductor Inc.

• Lee J‐h

  Memory R&d Division Hynix Semiconductor Inc.

• Jang Se-aug

  R&d Division Hynix Semiconductor Inc.

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著作論文

• Impact of In Situ NH_3 Preannealing on Sub-100nm Tungsten Polymetal Gate Electrode during the Sealing Nitride Formation

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