YOON Hyoung-Kil | NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno

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LEE Jun-Hee
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
YOON Hyoung-Kil
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
Yoon H‐k
Korea Advanced Inst. Of Sci. And Technol. Daejon Kor
Lee Jung-ho
Memory R&d Division Hynix Semiconductor Inc.
Lee J‐h
Memory R&d Division Hynix Semiconductor Inc.
JEONG Jaehwa
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
GWEON Dae-Gab
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
OH Hyeong-Ryeol
Han-yang University
LEE Moon
NOM Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Techno
Gweon Dae-gab
Nom Laboratary Department Of Mechanical Engineering
Jeong Jaehwa
NOM Lab., Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 373-1 Guseong-Dong, Yuseong-Gu, ME3265, Daejeon 305-701, Korea
Yoon Hyoung-Kil
NOM Lab., Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 373-1 Guseong-Dong, Yuseong-Gu, ME3265, Daejeon 305-701, Korea
Lee Jun-Hee
NOM Lab., Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 373-1 Guseong-Dong, Yuseong-Gu, ME3265, Daejeon 305-701, Korea
Gweon Dae-Gab
NOM Lab., Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 373-1 Guseong-Dong, Yuseong-Gu, ME3265, Daejeon 305-701, Korea

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