Thickness Dependence of Photoacoustic Spectra in High-Resistivity GaAS : Physical Acoustics II
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1981-09-01
著者
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ISHIGURO Takehiko
Electrotechnical Laboratory
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TOKUMOTO Madoka
Electrotechnical Laboratory
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TANINO Hiroshi
Electrotechnical Laboratory
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TOKUMOTO Hiroshi
Electrotechmical Laboratory
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Ishiguro Takehiko
Electrotechincal Laboratory
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Ishiguro T
Nagaoka Univ. Technol. Nagaoka Jpn
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Tokumoto Hiroshi
Electrotechincal Laboratory
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Tokumoto Madoka
Electronics and Photonics Research Institute (EPRI), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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