X-ray Photoelectron and Raman Spectra of TMTTF-TCNQ:Estimation of the Valence Fluctuation Time and the Degree of Charge Transfer
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概要
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The X-ray photoelectron and Raman spectra of quasi one-dimensional con-ductor TMTTF-TCNQ were measured at room temperature. A combinedanalysis of N Is (or S 2p) core level XPS spectra and Raman spectra is shown togive a characteristic time scale (rx10 " sec) of valence fluctuation in thismixed-valence complex. From the Raman frequency of TCNQ v. band, thedegree of charge transfer in TMTTF-TCNQ is given to be 0.50j0.05, which issmaller than that in TTF-TCNQ and is close to a commensurate value.
- 社団法人日本物理学会の論文
- 1982-01-15
著者
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ANZAI Hiroyuki
Electrotechnical Laboratory
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ISHIGURO Takehiko
Electrotechnical Laboratory
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TOKUMOTO Madoka
Electrotechnical Laboratory
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KINOSHITA Nobumori
Electrotechnical Laboratory
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ANZAI Hiroyuki
Department of Material Science, Himeji Institute of Technology
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Koshizuka Naoki
Electrotechnical Laboratory
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Anzai Hiroyuki
Electrotechnical Laboratory Umezono
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Ishiguro Takehiko
Electrotechincal Laboratory
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Anzai H
Department Of Material Science Faculty Of Science Himeji Institute For Technology
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Kinoshita N
Electrotechnical Laboratory
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Ishiguro T
Nagaoka Univ. Technol. Nagaoka Jpn
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Anzai Hiroyuki
Electrotechmical Laboratory
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Tokumoto Madoka
Electronics and Photonics Research Institute (EPRI), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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