Secondary Electron Ejection from Contaminated Metal Surface by He and Ar Atoms
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概要
- 論文の詳細を見る
Secondary electron yields γ_0 on a contaminated Cu-Be surface for neutral He and Ar atoms of 19eV to 500eV have been measured. The neutral beams are produced from the ground state ion beams by charge transfer with the same kind of atoms. The yields γ_0 obtained are confirmed to be of the ground state atoms. The values of γ_0 are 0.58 for He and 0.24 for Ar at 500eV, and rapidly decrease to 6×10^<-6> for He and 2×10^<-6> for Ar at 19eV. The ejection mechanism is discussed. In the case of Ar, the secondary electron yield increases notably when the electron energy producing the primary ion beam is increased above 32eV. This indicates that metastable atoms Ar^m are produced from metastable ions Ar^<+m> by the charge transfer process Ar^<+m>+Ar→Ar^m+Ar^+. This fact can be used as a new technique of detecting metastable ions. An example of its application is presented.
- 社団法人応用物理学会の論文
- 1974-10-05
著者
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KANEKO Yozaburo
Department of Physics,Faculty of Science,Tokyo Metropolitan University
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Kaneko Yozaburo
Department Of Physics Faculty Of Science Tokyo Metoropoliton University
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KADOTA Kiyoshi
Department of Electronics, Nagoya University
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Kadota Kiyoshi
Department Of Electronics Nagoya University
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Kadota Kiyoshi
Department Of Physics Faculty Of Science Tokyo Metropolitan University
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