Multiple Ionization of Ar and Mg by Electron Impact
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概要
- 論文の詳細を見る
Ionization efficiency curves (IE curves) of Ar and Mg are measured up to 100 eV by crossed beam method. A mass spectrometer is used for separation of multiply charged ions. Abundance ratios of multiply charged ions to singly charged ion at 500 eV are obtained up to five fold and three fold charge for Ar and Mg respectively. The summations of the IE curves of multiply charged ions agree well with the absolute total ionization curves obtained by other workers. The IE curve of Ar^+ has two maxima at 45 eV and 90 eV. Remarkable structures are found at 255 eV for Ar^<3+> and Ar^<4+> and they are attributed to an Auger process or an electron shake-off caused by the ionization of inner shell electrons. A break at 55 eV for Mg^<2+> is probably attributed to autoionization arising from the excitation of inner shell electron which occurs below 55 eV. The curves for Ar^<2+>, Mg^+ and Mg^<3+> seem to have no structures.
- 社団法人日本物理学会の論文
- 1970-06-05
著者
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OKUDAIRA Sadayuki
Department of Surgery, Nagasaki University Graduate School of Biomedical Sciences
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KANEKO Yozaburo
Department of Physics,Faculty of Science,Tokyo Metropolitan University
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Kaneko Yozaburo
Department Of Physics Faculty Of Science Tokyo Metoropoliton University
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KANOMATA Ichiro
Department of Physics, Faculty of Science, Tokyo Metropolitan University
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Kanomata Ichiro
Department Of Physics Faculity Of Science Tokyo Metropolitan University
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Okudaira Sadayuki
Department Of Physics Faculty Of Science Tokyo Metroplitan University
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Okudaira Sadayuki
Department Of Physics Faculty Of Science Tokyo Metropolitan University
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