Phase-Shifting Technology for ULSI Patterning (Special Issue on Opto-Electronics and LSI)

概要

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Fabrication of 0.2 to 0.3 μm features is vital for future ultralarge scale integration devices. An area of particular concern is whether optical lithography can delineate such feature sizes, i.e., less than the exposure wavelength. The use of a phase shift mask is one of the most effective means of improving resolution in optical lithography. This technology basically makes use of the interference between light transmitting through adjacent apertures of the mask. Various types of phase shift masks and their imaging characteristics are discussed and compared with conventional normal transmission masks. To apply these masks effectively to practical patterns, a phase shifter pattern design tool and mask repair method must be established. The phase shifting technology offers a potential to fabricate 0.3 μm features by using the current i-line stepper, and 0.2 μm features by using excimer laser stepper.
社団法人電子情報通信学会の論文
1993-01-25